Global Committee Meeting Minutes


SEMI International Standards
Committee Meeting Minutes

Below you will find the committee minutes for all the regional committees within the SEMI Standards Program. These minutes are the official records for all committee and document activity.

Note that the list below is by the Global Technical Committee, with the most recent committee meeting listed first.

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Show details for 3DS-IC3DS-IC
Show details for Assembly & PackagingAssembly & Packaging
Show details for Automated Test EquipmentAutomated Test Equipment
Show details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Show details for EHSEHS
Show details for FacilitiesFacilities
Show details for FPD - Color Filter & Optical ElementsFPD - Color Filter & Optical Elements
Show details for FPD - Factory AutomationFPD - Factory Automation
Show details for FPD - MaskFPD - Mask
Show details for FPD - Materials & ComponentsFPD - Materials & Components
Hide details for FPD - MetrologyFPD - Metrology
Feb 14, 2014 Korea FPD - Metrology Available in English
Jan 21, 2014 Taiwan FPD - Metrology Available in English
Nov 7, 2013 Korea FPD - Metrology Available in EnglishMinutes have not been reviewed
Oct 24, 2013 Japan FPD - Metrology Available in English
Sep 27, 2013 Taiwan FPD - Metrology Available in English
Jul 25, 2013 Korea FPD - Metrology Available in English
Jun 28, 2013 Taiwan FPD - Metrology Available in English
Apr 25, 2013 Korea FPD - Metrology Available in English
Apr 12, 2013 Japan FPD - Metrology Available in English
Feb 1, 2013 Korea FPD - Metrology Available in English
Nov 2, 2012 Japan FPD - Metrology Available in English
Oct 12, 2012 Korea FPD - Metrology Available in English
Jun 14, 2012 Korea FPD - Metrology Available in English
May 24, 2012 Taiwan FPD - Metrology Available in English
Apr 27, 2012 Japan FPD - Metrology Available in English
Mar 7, 2012 Korea FPD - Metrology Available in English
Mar 6, 2012 Taiwan FPD - Metrology Available in English
Nov 25, 2011 Taiwan FPD - Metrology Available in English
Oct 28, 2011 Japan FPD - Metrology Available in English
Oct 12, 2011 Korea FPD - Metrology Available in English
Jul 21, 2011 Taiwan FPD - Metrology Available in English
Jul 6, 2011 Taiwan FPD - Metrology Available in English
Apr 27, 2011 Korea FPD - Metrology Available in English
Mar 11, 2011 Taiwan FPD - Metrology Available in English
Jan 28, 2011 Korea FPD - Metrology Available in English
Dec 7, 2010 Taiwan FPD - Metrology Available in English
Nov 8, 2010 Japan FPD - Metrology Available in English
Oct 15, 2010 Korea FPD - Metrology Available in English
Sep 23, 2010 Taiwan FPD Available in English
Jul 7, 2010 Korea FPD - Metrology Available in English
Jun 24, 2010 Taiwan FPD - Metrology Available in English
Apr 19, 2010 Japan FPD - Metrology Available in English
Feb 4, 2010 Korea FPD - Metrology Available in English
Dec 24, 2009 Taiwan FPD Available in EnglishMinutes have not been reviewed
Nov 12, 2009 Taiwan FPD Available in English
Oct 30, 2009 Japan FPD - Metrology Available in English
Oct 22, 2009 Korea FPD - Metrology Available in English
Sep 30, 2009 Taiwan FPD Available in English
Jun 25, 2009 Taiwan FPD Available in English
Jun 18, 2009 Korea FPD - Metrology Available in English
May 14, 2009 Japan FPD - Metrology Available in English
Mar 26, 2009 Taiwan FPD - Metrology Available in English
Jan 21, 2009 Korea FPD - Metrology Available in English
Dec 17, 2008 Taiwan FPD Available in English
Show details for GasesGases
Show details for Gases & FacilitiesGases & Facilities
Show details for HB-LEDHB-LED
Show details for Information & ControlInformation & Control
Show details for Liquid ChemicalsLiquid Chemicals
Show details for MEMSMEMS
Show details for MEMS / NEMSMEMS / NEMS
Show details for MetricsMetrics
Show details for MicropatterningMicropatterning
Show details for PhotovoltaicPhotovoltaic
Show details for Photovoltaic - AutomationPhotovoltaic - Automation
Show details for Photovoltaic - MaterialsPhotovoltaic - Materials
Show details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Show details for Silicon WaferSilicon Wafer
Show details for TraceabilityTraceability

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