Global Committee Meeting Minutes


SEMI International Standards
Committee Meeting Minutes

Below you will find the committee minutes for all the regional committees within the SEMI Standards Program. These minutes are the official records for all committee and document activity.

Note that the list below is by the Global Technical Committee, with the most recent committee meeting listed first.

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Show details for 3DS-IC3DS-IC
Show details for Assembly & PackagingAssembly & Packaging
Show details for Automated Test EquipmentAutomated Test Equipment
Show details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Show details for EHSEHS
Show details for FacilitiesFacilities
Show details for FPD - Color Filter & Optical ElementsFPD - Color Filter & Optical Elements
Show details for FPD - Factory AutomationFPD - Factory Automation
Show details for FPD - MaskFPD - Mask
Show details for FPD - Materials & ComponentsFPD - Materials & Components
Show details for FPD - MetrologyFPD - Metrology
Show details for GasesGases
Show details for Gases & FacilitiesGases & Facilities
Show details for HB-LEDHB-LED
Show details for Information & ControlInformation & Control
Show details for Liquid ChemicalsLiquid Chemicals
Show details for MEMSMEMS
Show details for MEMS / NEMSMEMS / NEMS
Hide details for MetricsMetrics
Oct 30, 2013 North America Metrics Available in EnglishMinutes have not been reviewed
Jul 10, 2013 North America Metrics Available in English
Apr 3, 2013 North America Metrics Available in English
Oct 31, 2012 North America Metrics Available in English
Jul 11, 2012 North America Metrics Available in English
Apr 11, 2012 Japan Metrics Available in English
Apr 4, 2012 North America Metrics Available in English
Dec 8, 2011 Japan Metrics Available in English
Oct 26, 2011 North America Metrics Available in English
Oct 12, 2011 Europe Equipment Automation Available in English
Sep 16, 2011 Japan Metrics Available in English
Jul 13, 2011 North America Metrics Available in English
Apr 13, 2011 Japan Metrics Available in English
Mar 30, 2011 North America Metrics Available in English
Dec 2, 2010 Japan Metrics Available in English
Nov 9, 2010 North America Metrics Available in English
Oct 19, 2010 Europe Equipment Automation Available in English
Oct 4, 2010 Japan Metrics
Sep 17, 2010 Japan Metrics
Jul 14, 2010 North America Metrics Available in English
Jun 10, 2010 Europe Equipment Automation Available in English
Apr 14, 2010 Japan Metrics
Mar 31, 2010 North America Metrics Available in English
Jan 15, 2010 Japan Metrics
Nov 4, 2009 North America Metrics Available in English
Oct 9, 2009 Europe Equipment Automation Available in English
Sep 10, 2009 Japan Metrics
Jul 15, 2009 North America Metrics Available in English
May 21, 2009 Japan Metrics
Apr 1, 2009 North America Metrics Available in English
Nov 5, 2008 North America Metrics Available in English
Show details for MicropatterningMicropatterning
Show details for PhotovoltaicPhotovoltaic
Show details for Photovoltaic - AutomationPhotovoltaic - Automation
Show details for Photovoltaic - MaterialsPhotovoltaic - Materials
Show details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Show details for Silicon WaferSilicon Wafer
Show details for TraceabilityTraceability

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