SEMI International Standards
Committee Meeting Minutes
Below you will find the committee minutes for all the regional committees within the SEMI Standards Program. These minutes are the official records for all committee and document activity.
Note that the list below is by the Global Technical Committee, with the most recent committee meeting listed first.
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| 3DS-IC |
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 | Automated Test Equipment |
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| Oct 26, 2011 | | | | | | NA Automated Test Equipment | | | | | | Available in English | | |
| Jul 13, 2011 | | | | | | NA Automated Test Equipment | | | | | | Available in English | | |
| Jul 14, 2010 | | | | | | NA Automated Test Equipment | | | | | | Available in English | Minutes have not been reviewed | |
| Jul 2, 2010 | | | | | | Japan FPD - Materials & Components | | | | | | | | |
| Apr 15, 2010 | | | | | | Japan Test | | | | | | | | |
| Feb 23, 2010 | | | | | | NA Automated Test Equipment | | | | | | Available in English | | |
| Feb 19, 2010 | | | | | | Japan Automated Test Equipment | | | | | | | | |
| Oct 20, 2009 | | | | | | Japan Test | | | | | | | | |
| Jul 15, 2009 | | | | | | NA Automated Test Equipment | | | | | | Available in English | | |
| Jul 7, 2009 | | | | | | Japan Test | | | | | | | | |
| Compound Semiconductor Materials |
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| EHS |
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| FPD - Color Filter & Optical Elements |
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| FPD - Mask |
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| FPD - Materials & Components |
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| FPD - Metrology |
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| Gases & Facilities |
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| Information & Control |
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| MEMS |
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| Metrics |
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| Photovoltaic |
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| Photovoltaic - Automation |
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| Photovoltaic - Materials |
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| Physical Interfaces & Carriers |
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| Silicon Wafer |
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