Global Committee Meeting Minutes


SEMI International Standards
Committee Meeting Minutes

Below you will find the committee minutes for all the regional committees within the SEMI Standards Program. These minutes are the official records for all committee and document activity.

Note that the list below is by the Global Technical Committee, with the most recent committee meeting listed first.

Navigation Tips:
1. Click on the "twistie" to view the items under each heading.
2. To use the display navigator bar, click on:
EXPAND - to expand all sections
COLLAPSE - to collapse all sections.

Expand | Collapse
Show details for 3DS-IC3DS-IC
Show details for Assembly & PackagingAssembly & Packaging
Show details for Automated Test EquipmentAutomated Test Equipment
Show details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Hide details for EHSEHS
Apr 1, 2014 Taiwan EHS Available in English
Dec 6, 2013 Japan EHS Available in English
Oct 31, 2013 North America EHS Available in English
Sep 26, 2013 Japan EHS Available in English
Jul 11, 2013 North America EHS Available in English
Apr 18, 2013 Japan EHS Available in English
Apr 4, 2013 North America EHS Available in English
Dec 7, 2012 Japan EHS Available in English
Nov 1, 2012 North America EHS Available in English
Sep 25, 2012 Japan EHS Available in English
Jul 12, 2012 North America EHS Available in English
Apr 19, 2012 Japan EHS Available in English
Apr 5, 2012 North America EHS Available in English
Dec 9, 2011 Japan EHS Available in English
Oct 27, 2011 North America EHS Available in EnglishMinutes have not been reviewed
Oct 25, 2011 Taiwan EHS Available in English
Sep 26, 2011 Japan EHS Available in English
Jul 14, 2011 North America EHS Available in EnglishMinutes have not been reviewed
Apr 19, 2011 Japan EHS Available in English
Apr 15, 2011 Taiwan EHS Available in English
Mar 31, 2011 North America EHS Available in English
Dec 3, 2010 Japan EHS Available in English
Nov 11, 2010 North America EHS Available in English
Sep 16, 2010 Japan EHS Available in English
Jul 16, 2010 North America EHS Available in English
Apr 15, 2010 Japan EHS Available in English
Apr 1, 2010 North America EHS Available in English
Dec 4, 2009 Japan EHS Available in English
Nov 5, 2009 North America EHS Available in English
Sep 24, 2009 Taiwan EHS Available in EnglishMinutes have not been reviewed
Sep 17, 2009 Japan EHS Available in English
Jul 16, 2009 North America EHS Available in English
Apr 14, 2009 Japan EHS Available in English
Apr 2, 2009 North America EHS Available in English
Nov 6, 2008 North America EHS Available in English
Show details for FacilitiesFacilities
Show details for FPD - Color Filter & Optical ElementsFPD - Color Filter & Optical Elements
Show details for FPD - Factory AutomationFPD - Factory Automation
Show details for FPD - MaskFPD - Mask
Show details for FPD - Materials & ComponentsFPD - Materials & Components
Show details for FPD - MetrologyFPD - Metrology
Show details for GasesGases
Show details for Gases & FacilitiesGases & Facilities
Show details for HB-LEDHB-LED
Show details for Information & ControlInformation & Control
Show details for Liquid ChemicalsLiquid Chemicals
Show details for MEMSMEMS
Show details for MEMS / NEMSMEMS / NEMS
Show details for MetricsMetrics
Show details for MicropatterningMicropatterning
Show details for PhotovoltaicPhotovoltaic
Show details for Photovoltaic - AutomationPhotovoltaic - Automation
Show details for Photovoltaic - MaterialsPhotovoltaic - Materials
Show details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Show details for Silicon WaferSilicon Wafer
Show details for TraceabilityTraceability

Expand | Collapse