SEMI International Standards
Standards Locale: North America
Committee: Photovoltaic (PV) - Materials
Place of Meeting: San Francisco Marriott Marquis, CA
Date of Meeting: 07/15/2015
Meeting End Date: 07/15/2015
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 07/24/2015


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
Doc. 5802A Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Triangulation SensorsFailed and returned to TF for reballot5802A Procedural Review.docx5802A Procedural Review.docx
Doc. 5803ANew Standard: Test Method for In Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Triangulation SensorsFailed and returned to TF for reballot5803A Procedural Review.docx5803A Procedural Review.docx
Doc. 5860 Line Item Revision of SEMI PV11-1110 Specification for Hydrofluoric Acid, Used In Photovoltaic ApplicationsPassed5860 Procedural Review.docx5860 Procedural Review.docx
Doc. 5861Line Item Revision of SEMI PV12-1110 Specification for Phosphoric Acid Used In Photovoltaic ApplicationsPassed5861 Procedural Review.docx5861 Procedural Review.docx
Doc. 5862Reapproval of SEMI PV3-0310 Guide for High Purity Water Used In Photovoltaic Cell ProcessingPassed5862 Procedural Review.docx5862 Procedural Review.docx
Doc. 5863Reapproval of SEMI PV5-1110 Guide for Oxygen (O2), Bulk, Used In Photovoltaic ApplicationsPassed5863 Procedural Review.docx5863 Procedural Review.docx
Doc. 5864 Reapproval of SEMI PV6-1110 Guide for Argon (Ar), Bulk, Used In Photovoltaic ApplicationsPassed5864 Procedural Review.docx5864 Procedural Review.docx
Doc. 5865 Reapproval of SEMI PV7-1110 Guide for Hydrogen (H2), Bulk, Used In Photovoltaic ApplicationsPassed5865 Procedural Review.docx5865 Procedural Review.docx
Doc. 5866 Reapproval of SEMI PV8-1110 Guide for Nitrogen (N2), Bulk, Used In Photovoltaic ApplicationsPassed5866 Procedural Review.docx5866 Procedural Review.docx


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities


#
Type
SC/TF/WG
Details
5894SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV10, Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon
5895SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision of SEMI PV16-0611 Specifications for Nitric Acid, Used in Photovoltaic Applications
5896SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV20-1011 Specifications for Hydrochloric Acid, Used in Photovoltaic Applications
5897SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV27-1011 Specifications for Ammonium Hydroxide, Used in Photovoltaic Applications
5898SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge
5899SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV30-0212 Specifications for 2-Propanol, Used in Photovoltaic Applications
5900SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV33-0212 Specifications for Sulfuric Acid, Used in Photovoltaic Applications
5901SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV36-0912 Specifications for Hydrogen Peroxide, Used in Photovoltaic Applications
5902SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV1-0211 Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry
5903SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV9-0611 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse
5904SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV14-0211 Guide for Phosphorus Oxychloride, Used in Photovoltaic Applications
5905SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV15-0211 Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor the Surface Roughness and Texture of PV Materials
5093SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection Auxiliary Document: Round Robin (Multi-laboratory Test) of SEMI PV9-1110 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurement of Microwave Reflectance After a Short Illumination Pulse - SNARF was abandoned.
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots

#
When
SC/TF/WG
Details
5895Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision of SEMI PV16-0611 Specifications for Nitric Acid, Used in Photovoltaic Applications
5896Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV20-1011 Specifications for Hydrochloric Acid, Used in Photovoltaic Applications
5897Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV27-1011 Specifications for Ammonium Hydroxide, Used in Photovoltaic Applications
5898Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge
5899Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV30-0212 Specifications for 2-Propanol, Used in Photovoltaic Applications
5900Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV33-0212 Specifications for Sulfuric Acid, Used in Photovoltaic Applications
5901Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Line Item Revision to SEMI PV36-0912 Specifications for Hydrogen Peroxide, Used in Photovoltaic Applications
5902Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV1-0211 Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry
5903Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV9-0611 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse
5904Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV14-0211 Guide for Phosphorus Oxychloride, Used in Photovoltaic Applications
5905Cycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection Reapproval of SEMI PV15-0211 Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor the Surface Roughness and Texture of PV Materials
5802BCycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Triangulation Sensors
5803BCycle 6/7-2015Int'l PV Analytical Test Methods, Metrology, and Inspection New Standard: Test Method for In Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Triangulation Sensors


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
Wednesday, November 4, 2015 10:30 AM - Noon at SEMI HQ in conjunction with NA Fall Standards Meeting.