SEMI International Standards
Standards Locale: North America |
Committee: Photovoltaic (PV) - Materials |
Place of Meeting: San Francisco Marriott Marquis, CA |
Date of Meeting: 07/15/2015 |
Meeting End Date: 07/15/2015 |
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Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 07/24/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
Doc. 5802A | Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Triangulation Sensors | Failed and returned to TF for reballot | 5802A Procedural Review.docx |
Doc. 5803A | New Standard: Test Method for In Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Triangulation Sensors | Failed and returned to TF for reballot | 5803A Procedural Review.docx |
Doc. 5860 | Line Item Revision of SEMI PV11-1110 Specification for Hydrofluoric Acid, Used In Photovoltaic Applications | Passed | 5860 Procedural Review.docx |
Doc. 5861 | Line Item Revision of SEMI PV12-1110 Specification for Phosphoric Acid Used In Photovoltaic Applications | Passed | 5861 Procedural Review.docx |
Doc. 5862 | Reapproval of SEMI PV3-0310 Guide for High Purity Water Used In Photovoltaic Cell Processing | Passed | 5862 Procedural Review.docx |
Doc. 5863 | Reapproval of SEMI PV5-1110 Guide for Oxygen (O2), Bulk, Used In Photovoltaic Applications | Passed | 5863 Procedural Review.docx |
Doc. 5864 | Reapproval of SEMI PV6-1110 Guide for Argon (Ar), Bulk, Used In Photovoltaic Applications | Passed | 5864 Procedural Review.docx |
Doc. 5865 | Reapproval of SEMI PV7-1110 Guide for Hydrogen (H2), Bulk, Used In Photovoltaic Applications | Passed | 5865 Procedural Review.docx |
Doc. 5866 | Reapproval of SEMI PV8-1110 Guide for Nitrogen (N2), Bulk, Used In Photovoltaic Applications | Passed | 5866 Procedural Review.docx |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5894 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV10, Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon |
5895 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision of SEMI PV16-0611 Specifications for Nitric Acid, Used in Photovoltaic Applications |
5896 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV20-1011 Specifications for Hydrochloric Acid, Used in Photovoltaic Applications |
5897 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV27-1011 Specifications for Ammonium Hydroxide, Used in Photovoltaic Applications |
5898 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge |
5899 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV30-0212 Specifications for 2-Propanol, Used in Photovoltaic Applications |
5900 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV33-0212 Specifications for Sulfuric Acid, Used in Photovoltaic Applications |
5901 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV36-0912 Specifications for Hydrogen Peroxide, Used in Photovoltaic Applications |
5902 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV1-0211 Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry |
5903 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV9-0611 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse |
5904 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV14-0211 Guide for Phosphorus Oxychloride, Used in Photovoltaic Applications |
5905 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV15-0211 Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor the Surface Roughness and Texture of PV Materials |
5093 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection | Auxiliary Document: Round Robin (Multi-laboratory Test) of SEMI PV9-1110 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurement of Microwave Reflectance After a Short Illumination Pulse - SNARF was abandoned. |
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
# | When | SC/TF/WG | Details |
5895 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision of SEMI PV16-0611 Specifications for Nitric Acid, Used in Photovoltaic Applications |
5896 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV20-1011 Specifications for Hydrochloric Acid, Used in Photovoltaic Applications |
5897 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV27-1011 Specifications for Ammonium Hydroxide, Used in Photovoltaic Applications |
5898 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge |
5899 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV30-0212 Specifications for 2-Propanol, Used in Photovoltaic Applications |
5900 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV33-0212 Specifications for Sulfuric Acid, Used in Photovoltaic Applications |
5901 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Line Item Revision to SEMI PV36-0912 Specifications for Hydrogen Peroxide, Used in Photovoltaic Applications |
5902 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV1-0211 Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry |
5903 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV9-0611 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse |
5904 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV14-0211 Guide for Phosphorus Oxychloride, Used in Photovoltaic Applications |
5905 | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | Reapproval of SEMI PV15-0211 Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor the Surface Roughness and Texture of PV Materials |
5802B | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Triangulation Sensors |
5803B | Cycle 6/7-2015 | Int'l PV Analytical Test Methods, Metrology, and Inspection | New Standard: Test Method for In Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Triangulation Sensors |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Wednesday, November 4, 2015 10:30 AM - Noon at SEMI HQ in conjunction with NA Fall Standards Meeting.
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