SEMI International Standards
Standards Locale: Japan |
Committee: Silicon Wafer |
Place of Meeting: SEMI Japan /OVTCCM |
Date of Meeting: 04/13/2023 |
Meeting End Date: 04/13/2023 |
|
Recording SEMI Standards Staff: Mami Nakajo |
CER Posted to Web: 04/27/2023 |
Leadership Changes
None.
Committee Structure Changes
Previous WG/TF/SC Name | New WG/TF/SC Name or Status Change |
JA Shipping Box TF | Disband |
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
# | TF | Title | Expiration Date |
5772 | Japan Test Method Task Force | Revision of MF391-0310: Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-state Surface photovoltage | 2024/09/11 |
6687 | Japan Test Method Task Force | Revision of M51: Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity | 2024/10/02 |
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
Standard Designation | Title |
SEMI M31-0718 | Specification for Mechanical Features of Front-Opening Shipping Box Used to Transport and Ship 300 mm Wafers |
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting is scheduled for Friday, August 25, 10:00am-12:00[JST](Hybrid)
Please check www.semi.org/standards for updates.
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