SEMI International Standards
Standards Locale: North America |
Committee: MEMS / NEMS |
Place of Meeting: SEMI Headquarters |
Date of Meeting: 11/06/2017 |
Meeting End Date: 11/06/2017 |
|
Recording SEMI Standards Staff: Laura Nguyen |
CER Posted to Web: 11/16/2017 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5267 | New Standard, Specification for Microfluidic Port and Pitch Dimensions | Passed, as balloted | 5267AProceduralReview.pdf |
NOTE 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
NOTE 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
MEMS & Sensors Technical Congress (February 13-14, 2018)
Next Meeting
The next meeting of the MEMS/NEMS North America TC Chapter is scheduled for Monday, April 9, at the SEMI Standards North America Spring 2018 Meetings located at SEMI Headquarters in Milpitas, California.
For more information, please visit the Standards Calendar at http://www.semi.org/en/standards.
Tentative Schedule:
Monday, April 9
13:30-16:00 MEMS / NEMS (C) and Joint SEMI MSIG, MEMS Characterization, MEMS Substrate (TF)s
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