SEMI International Standards
Standards Locale: North America
Committee: 3DS-IC
Place of Meeting: San Francisco Marriott Marquis Hotel in San Francisco, California
Date of Meeting: 07/14/2015
Meeting End Date: 07/14/2015
Recording SEMI Standards Staff: Paul Trio
CER Posted to Web: 07/22/2015


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5823
Revision to SEMI 3D2-1113, Specification for Glass Carrier Wafers for 3DS-IC ApplicationsFailed, to be reballoted5823 Ballot Review FAILED.docx5823 Ballot Review FAILED.docx


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots

#
When
SC/TF/WG
Details
5823A
Cycle 6 or 7, 2015Bonded Wafer Stacks TFRevision to SEMI 3D2, Specification for Glass Carrier Wafers for 3DS-IC Applications


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
NA Standards Fall 2015 Meetings
November 2-5, 2015
SEMI Headquarters
3081 Zanker Road
San Jose, California 94103
U.S.A.

Tuesday, November 3
- Inspection & Metrology TF (9:00 AM to 10:30 AM)
- Bonded Wafer Stacks TF (10:30 AM to 12:00 Noon)
- NA 3DS-IC Committee (1:30 PM to 3:30 PM)

For more information, please visit: http://www.semi.org/standards