SEMI International Standards
Standards Locale: North America |
Committee: 3DS-IC |
Place of Meeting: San Francisco Marriott Marquis Hotel in San Francisco, California |
Date of Meeting: 07/14/2015 |
Meeting End Date: 07/14/2015 |
|
Recording SEMI Standards Staff: Paul Trio |
CER Posted to Web: 07/22/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5823 | Revision to SEMI 3D2-1113, Specification for Glass Carrier Wafers for 3DS-IC Applications | Failed, to be reballoted | 5823 Ballot Review FAILED.docx |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
# | When | SC/TF/WG | Details |
5823A | Cycle 6 or 7, 2015 | Bonded Wafer Stacks TF | Revision to SEMI 3D2, Specification for Glass Carrier Wafers for 3DS-IC Applications |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
NA Standards Fall 2015 Meetings
November 2-5, 2015
SEMI Headquarters
3081 Zanker Road
San Jose, California 94103
U.S.A.
Tuesday, November 3
- Inspection & Metrology TF (9:00 AM to 10:30 AM)
- Bonded Wafer Stacks TF (10:30 AM to 12:00 Noon)
- NA 3DS-IC Committee (1:30 PM to 3:30 PM)
For more information, please visit: http://www.semi.org/standards
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