SEMI International Standards
Standards Locale: Japan |
Committee: Assembly & Packaging |
Place of Meeting: SEMI Japan office, Tokyo |
Date of Meeting: 10/18/2016 |
Meeting End Date: 10/18/2016 |
|
Recording SEMI Standards Staff: Chie Yanagisawa |
CER Posted to Web: 11/01/2016 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
6031 | Revision to SEMI G21-94: SPECIFICATION FOR PLATING INTEGRATED CIRCUIT LEADFRAMES | Passed as balloted
Superclean | #6031_LetterBallotReviewSheet_G21.pdf |
6032 | Revision to SEMI G41-87: SPECIFICATION FOR DUAL STRIP SOIC LEADFRAME | Passed as balloted
Superclean | #6032_LetterBallotReviewSheet_G41.pdf |
6027 | Line Item Revision to SEMI G86-0303 (Reapproved 0811):
TEST METHOD FOR MEASUREMENT OF CHIP (DIE) STRENGTH BY MEAN OF 3-POINT BENDING | -- | #6027_LineItemLetterBallotReviewSheet_G86.pdf |
Line Item 1 | Add SEMI G96 to § 3 as a referenced Standard | Passed as balloted
Superclean | -- |
Line Item 2 | Add a note to ¶ 8.2 in order to clarify the conditions of the procedure | Passed as balloted
Superclean | -- |
6029 | Reapproval of SEMI G88-0211: SPECIFICATION FOR TAPE FRAME FOR 450 mm WAFER | Passed as balloted | #6029_LetterBallotReviewSheet_disco_G88.pdf |
6028 | Line Item Revision to SEMI G97-0116: SPECIFICATION FOR ADHESIVE TRAY USED FOR THIN CHIP HANDLING | -- | #6028_LineItemLetterBallotReviewSheet_G97.pdf |
Line Item 1 | Modify the Figure 3, Figure 9 and Table 2 in order to clarify the original drawings | Passed as balloted
Superclean | -- |
Note 1:
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
New Task Force Activities
# | Type | SC/TF/WG | Details |
6093 | SNARF | 5 Year Review TF | Revision to SEMI G31-0997: TEST METHOD FOR DETERMINING THE ABRASIVE CHARACTERISTICS OF MOLDING COMPOUNDS |
6094 | SNARF | 5 Year Review TF | Revision to SEMI G45-93: RECOMMENDED PRACTICE FOR FLASH CHARACTERISTICS OF THERMOSETTING MOLDING COMPOUNDS, with title change to PRACTICE FOR FLASH CHARACTERISTICS OF THERMOSETTING MOLDING COMPOUNDS |
6095 | SNARF | 5 Year Review TF | Revision to SEMI G49-93: SPECIFICATION FOR PLASTIC MOLDING PREFORMS |
Note 2: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
Listing of documents approved by the committee for letter ballot.
# | When | SC/TF/WG | Details |
6093 | Cycle 1-2017 | 5 Year Review TF | Revision to SEMI G31-0997: TEST METHOD FOR DETERMINING THE ABRASIVE CHARACTERISTICS OF MOLDING COMPOUNDS |
6094 | Cycle 1-2017 | 5 Year Review TF | Revision to SEMI G45-93: RECOMMENDED PRACTICE FOR FLASH CHARACTERISTICS OF THERMOSETTING MOLDING COMPOUNDS, with title change to PRACTICE FOR FLASH CHARACTERISTICS OF THERMOSETTING MOLDING COMPOUNDS |
6095 | Cycle 1-2017 | 5 Year Review TF | Revision to SEMI G49-93: SPECIFICATION FOR PLASTIC MOLDING PREFORMS |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
SEMI G76-0299 (Reapproved 0706): SPECIFICATION FOR POLYIMIDE-BASED ADHESIVE TAPE USED IN TAPE CARRIER PACKAGES (TCP)
SNARF for Reapproval of SEMI G76-0299 (Reapproved 0706) and the ballot submission for Cycle 7-2016 were approved by the GCS on July 28, 2016. However, the TC Chapter agreed to get this Standard inactive at this meeting.
Next Meeting
The next meeting of Assembly & Packaging Japan TC Chapter will be held on Monday, March 13, 2017, 15:00-17:00 at SEMI Japan office in conjunction with Japan Standards Spring Meetings.
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