SEMI International Standards
Standards Locale: North America
Committee: Traceability
Place of Meeting: OVTCCM
Date of Meeting: 04/07/2021
Meeting End Date: 04/07/2021
Recording SEMI Standards Staff: Michelle Sun
CER Posted to Web: 04/20/2021


Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
5-Year Review Task ForceMasanori YoshiseEmily Liew (X-Fab)


Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
6448New Standard – Specification for Equipment and Materials LabelsFailed


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots

#
When
TF
Details
6448ACycle 4- or 5-2021EMT TFNew Standard – Specification for Equipment and Materials Labels
6698Cycle 4- or 5-20215-Year Review TFRevision of SEMI M12-0706 (reapproved 0318), Specification for Serial Alphanumeric Marking of the Front Surface of Wafers, with title change to: Specification for Alphanumeric Marking of Wafers
6699Cycle 4- or 5-20215-Year Review TFRevision of SEMI M13-0706 (reapproved 0318), Specification for Alphanumeric Marking of Silicon Wafers (Subject: adding alphanumeric marking at back surface in addition to front surface.)


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
July 28, 2021, from 10:00 AM - 12:30 PM Pacific via OVTCCM