SEMI International Standards
Standards Locale: Japan
Committee: Traceability
Place of Meeting: Makuhari Messe, Chiba, Japan
Date of Meeting: 12/06/2013
Meeting End Date: 12/06/2013
Recording SEMI Standards Staff: Hirofumi Kanno
CER Posted to Web: 12/20/2013


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
#
Type
SC/TF/WG
Details
5689SNARFSiC Materials & Wafer Specification TFLine Item Revision of SEMI T5-1106 (Reapproved 1111)
Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next Japan Traceability Committee meeting is scheduled for April, 25, 2014 (15:00-17:30) at SEMI Japan Office, Tokyo, Japan.