SEMI International Standards
Standards Locale: Japan |
Committee: Traceability |
Place of Meeting: Makuhari Messe, Chiba, Japan |
Date of Meeting: 12/06/2013 |
Meeting End Date: 12/06/2013 |
|
Recording SEMI Standards Staff: Hirofumi Kanno |
CER Posted to Web: 12/20/2013 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
# | Type | SC/TF/WG | Details |
5689 | SNARF | SiC Materials & Wafer Specification TF | Line Item Revision of SEMI T5-1106 (Reapproved 1111)
Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers |
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next Japan Traceability Committee meeting is scheduled for April, 25, 2014 (15:00-17:30) at SEMI Japan Office, Tokyo, Japan.
Copyright ©2024 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.