SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Nuremberg, Germany
Date of Meeting: 04/17/2013
Meeting End Date: 04/17/2013
Recording SEMI Standards Staff: Yann Guillou
CER Posted to Web: 04/17/2013
Leadership Changes
GaSB, C in GAAsTF and EPD in GaAs TFs disbanded.
TC Chapter Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
| 5498 | Line Item Revision to SEMI M82-0712: Test Method for the Carbon Acceptor Concentration in Semi-Insulating Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy | Passed as balloted |  |
| 5499 | Revision to SEMI M83-1112, Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V-Compound Semiconductors | Passed with editorial change | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None
Next Meeting
Next Compound Semiconductor meeting will be held in conjunction with SEMICON Europa on October 9th. Check http://www.semiconeuropa.org/ for more details..
|