SEMI International Standards
Standards Locale: North America |
Committee: Information & Control |
Place of Meeting: SEMI HQ |
Date of Meeting: 04/13/2016 |
Meeting End Date: 04/13/2016 |
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Recording SEMI Standards Staff: James Amano |
CER Posted to Web: 04/13/2016 |
Leadership Changes
Group | Previous Leader | New Leader |
TC Chapter | Lance Rist | tbd |
ESEC TF | Gino Crispieri | Andreas Neuber |
Committee Structure Changes
None.
Ballot Results
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
6005 | SNARF | GEM300 TF | LI Revision to E30: Add SMN |
6008 | SNARF | DDA TF | New Auxiliary Information: Equipment Data Acquisition (EDA) Freeze Version Overview |
6009 | SNARF | DDA TF | Line Item Revision to E132, E132.1. |
6020 | SNARF | GEM300 TF | Line Item Revision to SEMI E30.1: Inspection and Review Specific Equipment Model (ISEM) to correct nonconforming title |
6021 | SNARF | GEM300 TF | Line Item revision to SEMI E123: Standard for Handler Equipment Specific Equipment Model (HSEM) to correct nonconforming title |
6022 | SNARF | DDA TF | Line Item Revision to SEMI E138: XML Semiconductor Common Components to correct nonconforming title |
6023 | SNARF | GEM300 TF | Line Item revision to SEMI E122: Standard for Tester Equipment Specific Equipment Model (TSEM) to correct nonconforming title |
6024 | SNARF | GEM300TF | Reapproval of SEMI E30.5: Specification for Metrology Specific Equipment Model (MSEM) |
6025 | SNARF | NA I&C Committee
5-Year Review | Reapproval of SEMI E142: Specification for Substrate Mapping |
TBA | SNARF | NA I&C Committee
5-Year Review | Reapproval of E54.10: Specification for Sensor/Actuator Network Specific Device Model for an In-Situ Particle Monitor Device |
TBA | SNARF | NA I&C Committee
5-Year Review | Reapproval of SEMI E109: Specification for Reticle and Pod Management (RPMS) |
TBA | SNARF | NA I&C Committee
5-Year Review | Reapproval of SEMI E121: Guide for Style and Usage of XML for Semiconductor Manufacturing Applications |
TBA | SNARF | NA I&C Committee
5-Year Review | Reapproval of SEMI E130: Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300) |
TBA | SNARF | NA I&C Committee
5-Year Review | Reapproval of SEMI E151: Guide for Understanding Data Quality |
TBA | SNARF | NA I&C Committee
5-Year Review | Reapproval of SEMI E160: Specification for Communication of Data Quality |
Authorized Ballots
# | When | SC/TF/WG | Details |
5549 | Cycle 5-2016 | GEM300 TF | Revision to SEMI E30, Generic Model for Communications and Control of Manufacturing Equipment (GEM) with title change to: Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM) |
R5274G | Cycle 4 or 5, 2016 | Sensor Bus TF | Revision to add a New SEMI E54 Subordinate Standard: Specification for Sensor/Actuator Network Specific Device Model for Generic Equipment add-on Sensor (ADDON) |
5716 | Cycle 5 or 6, 2016 | PCS TF | Revisions to SEMI E133, Specification for Automated Process Control Systems Interface and SEMI E133.1, Provisional Specification for XML Messaging for Process Control Systems (PCS) |
5821C | Cycle 4 or 5, 2016 | Energy Saving Equipment Communication Task Force | New Standard: Specification for Energy Savings Mode Communication between Semiconductor Equipment and Sub-Systems |
5872 | Cycle 5, 2016 | GEM300 TF | Line Item Revisions to SEMI E172, Specification for SECS Equipment Data Dictionary (SEDD) |
5912A | Cycle 5, 2016 | GEM300 TF | Line Item Revisions to:
- SEMI E142.1 -0211, XML Schema for Substrate Mapping
- SEMI E142.2-0211, SECS II Protocol for Substrate Mapping
- SEMI E142.3-0211, Web Services for Substrate Mapping
To correct nonconforming titles |
6020 | Cycle 5, 6, or 7, 2016 | GEM300 TF | Line Item revision to SEMI E30.1: Inspection and Review Specific Equipment Model (ISEM) to correct nonconforming title |
6021 | Cycle 5, 6, or 7, 2016 | GEM300 TF | Line Item revison to SEMI E123: Standard for Handler Equipment Specific Equipment Model (HSEM) to correct nonconforming title |
6022 | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Line Item revision to SEMI E138: XML Semiconductor Common Components to correct nonconforming title |
6023 | Cycle 5, 6, or 7, 2016 | GEM300 TF | Revision to SEMI E122: Standard for Tester Equipment Specific Equipment Model (TSEM) to correct nonconforming title |
6024 | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of SEMI E30.5: Specification for Metrology Specific Equipment Model (MSEM) |
6025 | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of SEMI E142: Specification for Substrate Mapping |
TBA | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of E54.10: Specification for Sensor/Actuator Network Specific Device Model for an In-Situ Particle Monitor Device |
TBA | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of SEMI E109: Specification for Reticle and Pod Management (RPMS) |
TBA | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of SEMI E121: Guide for Style and Usage of XML for Semiconductor Manufacturing Applications |
TBA | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of SEMI E130: Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300) |
TBA | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of SEMI E151: Guide for Understanding Data Quality |
TBA | Cycle 5, 6, or 7, 2016 | NA I&C Committee
5-Year Review | Reapproval of SEMI E160: Specification for Communication of Data Quality |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
The committee voted to allow the following Standards to go inactive:
E54.13: Specification for Sensor/Actuator Network Communications for Ethernet/IP(TM)
E139: Specification for Recipe and Parameter Management (RaP)
Next Meeting
Proposed Meeting Schedule for SEMICON West 2016 Meetings
· Monday, July 11
o I&C Leadership (12:00 Noon – 1:00 PM)
o DDA (1:00 PM – 3:00 PM)
o PCS (3:00 PM – 5:00 PM)
o I&C GCS (5:00 PM – 5:30 PM)
· Tuesday, July 12
o Energy Saving Equipment Communication (8:00 AM – 12:00 noon)
o GEM300 (1:00 PM – 3:30 PM)
o Sensor Bus (3:30 PM – 6:00 PM)
· Wednesday, July 13
o I&C Committee (8:00 AM – 4:30 PM)
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