SEMI International Standards
Standards Locale: Japan |
Committee: Traceability |
Place of Meeting: Tokyo Big Sight |
Date of Meeting: 12/18/2015 |
Meeting End Date: 12/18/2015 |
|
Recording SEMI Standards Staff: James Amano |
CER Posted to Web: 12/30/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5890 | Revision to SEMI T7-0415, Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol | Passed with editorial changes | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5971 | SNARF | 5-Year Review TF | Reapproval ballot for: SEMI T19-0311: Specification for Device Marking |
Authorized Ballots
# | When | SC/TF/WG | Details |
5971 | Cycle 1-2016 or Cycle 2-2016 | 5-Year Review TF | Reapproval ballot for: SEMI T19-0311: Specification for Device Marking (Intercommittee ballot to be issued to Silicon Wafer Committee) |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
The Chapter agreed to allow the below standards to go inactive:
- SEMI T12-0710: Specification for Tracing Jigs and Implements
- SEMI T13-1104 (Reapproved 0710): Specification for Device Tracking: Concepts, Behavior, and Services
The Chapter voted to disband the PV Traceability Task Force as it has had no activity for over two years.
Next Meeting
To be determined. Details, when available, will be posted to the SEMI Standards Calendar of Events: http://www.semi.org/en/Standards/CalendarEvents
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