SEMI International Standards
Standards Locale: Japan
Committee: Traceability
Place of Meeting: Tokyo Big Sight
Date of Meeting: 12/18/2015
Meeting End Date: 12/18/2015
Recording SEMI Standards Staff: James Amano
CER Posted to Web: 12/30/2015


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5890
Revision to SEMI T7-0415, Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code SymbolPassed with editorial changes


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
5971
SNARF5-Year Review TFReapproval ballot for: SEMI T19-0311: Specification for Device Marking


Authorized Ballots

#
When
SC/TF/WG
Details
5971
Cycle 1-2016 or Cycle 2-20165-Year Review TFReapproval ballot for: SEMI T19-0311: Specification for Device Marking (Intercommittee ballot to be issued to Silicon Wafer Committee)


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
The Chapter agreed to allow the below standards to go inactive:
  • SEMI T12-0710: Specification for Tracing Jigs and Implements
  • SEMI T13-1104 (Reapproved 0710): Specification for Device Tracking: Concepts, Behavior, and Services

The Chapter voted to disband the PV Traceability Task Force as it has had no activity for over two years.

Next Meeting
To be determined. Details, when available, will be posted to the SEMI Standards Calendar of Events: http://www.semi.org/en/Standards/CalendarEvents