SEMI International Standards
Standards Locale: North America |
Committee: Photovoltaic (PV) - Materials |
Place of Meeting: SEMI HQ, San Jose, CA |
Date of Meeting: 11/05/2014 |
Meeting End Date: 11/05/2014 |
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Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 11/05/2014 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5801 | SNARF | International PV Analytical Test Methods, Metrology, and Inspection Task Force | New Standard: Guide for the Planning, Implementing and Analyzing data from a Round Robin used to verify a Test Method |
5802 | SNARF | International PV Analytical Test Methods, Metrology, and Inspection Task Force | New Standard: Test Method for In-line, Noncontact Measurement of Saw Marks on Silicon Wafers for PV Applications Using Laser Position Sensor |
5803 | SNARF | International PV Analytical Test Methods, Metrology, and Inspection Task Force | New Standard: Test Method for In-line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Position Sensor |
4825 | SNARF | International PV Analytical Test Methods, Metrology, and Inspection Task Force | New Standard: Test Methods for Hg Probe Measurements of Crystalline Silicon PV Materials and Devices
SNARF was abandoned. |
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
NA Spring meeting, April 1, 2015, San Jose, CA. Check www.semi.org/standards for latest information. See below for tentative schedule.
Wednesday, April 1, 2015
- Int'l PV Analytical Test Methods, Metrology, and Inspection (TF)
- PV/Photovoltaic Materials (C)
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