SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Freiberg, Germany
Date of Meeting: 10/09/2014
Meeting End Date: 10/09/2014
Recording SEMI Standards Staff: Andrea Busch
CER Posted to Web: 10/22/2014


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
CommitteeAction
A&R Forms forApproved Ballots
3784BNew Standard: SPECIFICATION FOR 100 mm ROUND POLISHED MONO-CRYSTALLINE 4H AND 6H SILICON CARBIDE WAFERS Passed



Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots


#
When
SC/TF/WG
Details
5795Cycle 1 2015Resistivity TFApproval for balloting of Document NEW STANDARD: TEST METHOD FOR CONTACTLESS RESISTIVITY MEASUREMENT OF SEMI-INSULATING SEMICONDUCTORS

Editorial checks have to be close before.

M46
M63
M64		Cycle 1-20155Y review TF (M46, M63, M64)Approval for balloting revised Documents M46, M63, M64.

Editorial checks of references and document subtype have to be closed before.



SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
In conjunction with ERSC Meeting - April, 2015