SEMI International Standards
Standards Locale: China |
Committee: HB-LED |
Place of Meeting: Friend Plaza Hotel Dandong, No. 158 Middle Binjiang Road, Dandong, Liaoning, China |
Date of Meeting: 10/14/2016 |
Meeting End Date: 10/14/2016 |
|
Recording SEMI Standards Staff: Sophia Huang |
CER Posted to Web: 11/01/2016 |
Leadership Changes
Group | Previous Leader | New Leader |
Patterned Sapphire Substrate Task Force(new TF) | | Jianzhe Liu(ECBO) |
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5945 | New Standard: Test Method for Determining Orientation of A Sapphire Single Crystal | Passed as balloted | |
5775A | New Standard: Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers | Passed with editorial changes | |
5723A | New Standard: Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB- LED Wafers | Passed with editorial changes | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
| NEW TFOF | Patterned Sapphire Substrate Task Force | The task force has one leader and ten members. More members will join in after HB-LED China TC Chapter Fall Meeting 2016. Sophia will work with TF leader Jianzhe Liu to maintain TF roster.
|
Authorized Ballots
# | When | SC/TF/WG | Details |
5776 | Cycle 8-2016 | GaN based LED Epitaxial Wafer Task Force | New Standard: Test Method for Detecting Surface Defects of GaN based LED Epitaxial Wafer Used for Manufacturing HB-LED |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
HB-LED Standards Spring Meeting 2017, April 20, 2017, Thursday, Wuhu, Anhui.
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