SEMI International Standards
| Standards Locale: North America |
| Committee: Traceability |
| Place of Meeting: San Francisco Marriott in San Francisco, California |
| Date of Meeting: 07/13/2015 |
| Meeting End Date: 07/13/2015 |
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| Recording SEMI Standards Staff: David Bouldin |
| CER Posted to Web: 07/28/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the TC Chapter.
# | Type | SC/TF/WG | Details |
5923 | SNARF | 5 Year Review TF | Reapproval of T8-1110 - Specification for Marking of Glass Flat Panel Display Substrates with a Two-dimensional Matrix Code Symbol |
5924 | SNARF | 5 Year Review TF | Reapproval of T9-1110 - Specification for Marking of Metal Lead-frame Strips with a Two-dimensional Data Matrix Code Symbol |
5918 | SNARF | 5 Year Review TF | Reapproval of T12-0710 - Specification for Tracing Jigs and Implements |
5919 | SNARF | 5 Year Review TF | Reapproval of T13-1104 (Reapproved 0710) - Specification for Device Tracking: Concepts, Behavior, and Services |
5920 | SNARF | 5 Year Review TF | Reapproval of T16-0310 - Specification for Marking of Glass Flat Panel Display Substrates with a Two-dimensional Matrix Code Symbol |
5921 | SNARF | 5 Year Review TF | Reapproval of T19-0311 - Specification for Device Marking |
5922 | SNARF | 5 Year Review TF | Reapproval of T20-0710 - Specification for Authentication of Semiconductors and Related Products |
Authorized Ballots
Listing of documents approved by the TC Chapter for Letter Ballot.
# | When | SC/TF/WG | Details |
5923 | Cycle 7, 2015 | 5 Year Review TF | Reapproval of T8-1110 - Specification for Marking of Glass Flat Panel Display Substrates with a Two-dimensional Matrix Code Symbol |
5924 | Cycle 7, 2015 | 5 Year Review TF | Reapproval of T9-1110 - Specification for Marking of Metal Lead-frame Strips with a Two-dimensional Data Matrix Code Symbol |
5918 | Cycle 7, 2015 | 5 Year Review TF | Reapproval of T12-0710 - Specification for Tracing Jigs and Implements |
5919 | Cycle 7, 2015 | 5 Year Review TF | Reapproval of T13-1104 (Reapproved 0710) - Specification for Device Tracking: Concepts, Behavior, and Services |
5920 | Cycle 7, 2015 | 5 Year Review TF | Reapproval of T16-0310 - Specification for Marking of Glass Flat Panel Display Substrates with a Two-dimensional Matrix Code Symbol |
5921 | Cycle 7, 2015 | 5 Year Review TF | Reapproval of T19-0311 - Specification for Device Marking |
5922 | Cycle 7, 2015 | 5 Year Review TF | Reapproval of T20-0710 - Specification for Authentication of Semiconductors and Related Products |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
Standards Workshop Activity
At the North America NA Traceability TC Chapter meeting held July 12, in conjunction with the NA Standards SEMICON West 2015 Meetings, they approved an activity to organize a Standards Workshop for the Fall meetings on Security Requirements in the ITRS 2.0 and how the Standards Program can support the ITRS.
Next Meeting
Fall NA Standards Meetings
November 2-5, 2015
SEMI Headquarters
3081 Zanker Road
San Jose, CA 95134
U.S.A.
Monday, November 2
- 5 Year Review TF (9:00 AM to 11:00 AM)
- Traceability TC Chapter (11:00 AM to 12:30 PM)
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