SEMI International Standards
Standards Locale: Europe
Committee: Photovoltaic (PV) - Materials
Place of Meeting: Berlin
Date of Meeting: 03/13/2013
Meeting End Date: 03/13/2013
Recording SEMI Standards Staff: Yann Guillou
CER Posted to Web: 03/21/2013
Leadership Changes
None.
TC Chapter Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
| 5434 | New Standard: Test Method for In Line Measurement of Lateral Dimensional Characteristics of Square and Pseudo Square PV Silicon Wafers | Passed as ballotted |  |
| 5530 | New Standard: Specification for Orientation Fiducial Marks for PV Silicon Wafers | Passed as ballotted | |
| 5531 | Line Item Revision to SEMI PV40-0912, Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments | Passed as ballotted | |
| 5502 | Line Item Revision to SEMI PV39-0912, Test Method for In-Line Measurement of Cracks in PV Silicon Wafers by Dark Field Infrared Imaging | Passed as ballotted | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
| 5565 | SNARF | Silicon Materials | Line Item Revision to PV42, Test Method for In-Line Measurement of Waviness on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments |
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Next PV Materials meeting will occur in conjunction with INTERSOLAR Europe (June 19-21, 2013) in Munich.
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