SEMI International Standards
Standards Locale: North America |
Committee: Photovoltaic (PV) - Materials |
Place of Meeting: SEMI HQ, San Jose, CA |
Date of Meeting: 04/01/2015 |
Meeting End Date: 04/01/2015 |
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Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 04/15/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5802 | New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Position Sensor | Failed and returned to TF | |
5803 | New Standard: Test Method for In-Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Position Sensor | Failed and returned to TF | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5860 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Line Item of SEMI PV11-1110 SPECIFICATIONS FOR HYDROFLUORIC ACID, USED IN PHOTOVOLTAIC APPLICATIONS |
5861 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Line Item Revision of SEMI PV12-1110 SPECIFICATIONS FOR PHOSPHORIC ACID USED IN PHOTOVOLTAIC APPLICATIONS |
5862 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV3-0310 GUIDE FOR HIGH PURITY WATER USED IN PHOTOVOLTAIC CELL PROCESSING |
5863 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV5-1110 GUIDE FOR OXYGEN (O2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
5864 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV6-1110 GUIDE FOR ARGON (Ar), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
5865 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV7-1110 GUIDE FOR HYDROGEN (H2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
5866 | SNARF | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV8-1110 GUIDE FOR NITROGEN (N2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
# | When | SC/TF/WG | Details |
5860 | Cycle 4/5 | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Line Item of SEMI PV11-1110 SPECIFICATIONS FOR HYDROFLUORIC ACID, USED IN PHOTOVOLTAIC APPLICATIONS |
5861 | Cycle 4/5 | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Line Item Revision of SEMI PV12-1110 SPECIFICATIONS FOR PHOSPHORIC ACID USED IN PHOTOVOLTAIC APPLICATIONS |
5862 | Cycle 4/5 | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV3-0310 GUIDE FOR HIGH PURITY WATER USED IN PHOTOVOLTAIC CELL PROCESSING |
5863 | Cycle 4/5 | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV5-1110 GUIDE FOR OXYGEN (O2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
5864 | Cycle 4/5 | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV6-1110 GUIDE FOR ARGON (Ar), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
5865 | Cycle 4/5 | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV7-1110 GUIDE FOR HYDROGEN (H2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
5866 | Cycle 4/5 | Int'l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV8-1110 GUIDE FOR NITROGEN (N2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS |
5802A | Cycle 4/5 | nt'l PV Analytical Test Methods, Metrology, and Inspection TF | New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Triangulation Sensors |
5803A | Cycle 4/5 | Cnt'l PV Analytical Test Methods, Metrology, and Inspection TF | New Standard: Test Method for In-Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Triangulation Sensors |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
July 15, 2015 1:00 - 4:00 PM PDT, San Francisco Marriott Marquis in conjunction with Intersolar NA 2015
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