SEMI International Standards
Standards Locale: North America
Committee: Photovoltaic (PV) - Materials
Place of Meeting: SEMI HQ, San Jose, CA
Date of Meeting: 04/01/2015
Meeting End Date: 04/01/2015
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 04/15/2015


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5802
New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Position SensorFailed and returned to TF
5803
New Standard: Test Method for In-Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Position SensorFailed and returned to TF


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
5860
SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection TFLine Item of SEMI PV11-1110 SPECIFICATIONS FOR HYDROFLUORIC ACID, USED IN PHOTOVOLTAIC APPLICATIONS
5861
SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection TFLine Item Revision of SEMI PV12-1110 SPECIFICATIONS FOR PHOSPHORIC ACID USED IN PHOTOVOLTAIC APPLICATIONS
5862
SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV3-0310 GUIDE FOR HIGH PURITY WATER USED IN PHOTOVOLTAIC CELL PROCESSING
5863
SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV5-1110 GUIDE FOR OXYGEN (O2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
5864
SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV6-1110 GUIDE FOR ARGON (Ar), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
5865
SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV7-1110 GUIDE FOR HYDROGEN (H2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
5866
SNARFInt'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV8-1110 GUIDE FOR NITROGEN (N2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots

#
When
SC/TF/WG
Details
5860
Cycle 4/5Int'l PV Analytical Test Methods, Metrology, and Inspection TFLine Item of SEMI PV11-1110 SPECIFICATIONS FOR HYDROFLUORIC ACID, USED IN PHOTOVOLTAIC APPLICATIONS
5861
Cycle 4/5Int'l PV Analytical Test Methods, Metrology, and Inspection TFLine Item Revision of SEMI PV12-1110 SPECIFICATIONS FOR PHOSPHORIC ACID USED IN PHOTOVOLTAIC APPLICATIONS
5862
Cycle 4/5Int'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV3-0310 GUIDE FOR HIGH PURITY WATER USED IN PHOTOVOLTAIC CELL PROCESSING
5863
Cycle 4/5Int'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV5-1110 GUIDE FOR OXYGEN (O2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
5864
Cycle 4/5Int'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV6-1110 GUIDE FOR ARGON (Ar), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
5865
Cycle 4/5Int'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV7-1110 GUIDE FOR HYDROGEN (H2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
5866
Cycle 4/5Int'l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV8-1110 GUIDE FOR NITROGEN (N2), BULK, USED IN PHOTOVOLTAIC APPLICATIONS
5802A
Cycle 4/5nt'l PV Analytical Test Methods, Metrology, and Inspection TFNew Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Triangulation Sensors
5803A
Cycle 4/5Cnt'l PV Analytical Test Methods, Metrology, and Inspection TFNew Standard: Test Method for In-Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Triangulation Sensors


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
July 15, 2015 1:00 - 4:00 PM PDT, San Francisco Marriott Marquis in conjunction with Intersolar NA 2015