SEMI International Standards
Standards Locale: North America |
Committee: Physical Interfaces & Carriers |
Place of Meeting: SEMI Headquarters |
Date of Meeting: 11/08/2017 |
Meeting End Date: 11/08/2017 |
|
Recording SEMI Standards Staff: Laura Nguyen |
CER Posted to Web: 11/16/2017 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
- | TFOF | Electron Microscopy Workflow TF | Revision to TFOF |
6311 | SNARF | Electron Microscopy Workflow TF | New Standard, Specification for TEM Lamella Carrier Used in Electron Microscopy Workflows
- TC Member Review took place between 10/13/2017 and 10/27/2017 before approval at the TC Chapter Meeting. |
NOTE 1: SNARFs and TFOFs are available for review on the SEMI Web site at: http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
Standard Designation | Title |
SEMI E85 | Specification for Physical AMHS Stocker to Interbay Transport System Interoperability |
SEMI E73 | Specification for Vacuum Pump Interfaces - Dry Pumps |
SEMI E74 | Specification for Vacuum Pump Interfaces - Turbomolecular Pumps |
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting of the Physical Interfaces & Carriers North America TC Chapter is scheduled for Wednesday, April 11, at the SEMI Standards North America Spring 2018 Meetings located at SEMI Headquarters in Milpitas, California.
For more information, please visit the Standards Calendar at http://www.semi.org/en/standards.
Tentative Schedule:
Tuesday, April 9
15:00-17:00 Electron Microscopy Workflow TF
Wednesday, April 11
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