SEMI International Standards
Standards Locale: North America |
Committee: MEMS / NEMS |
Place of Meeting: Marriott Marquis Hotel, San Francisco, California/USA |
Date of Meeting: 07/13/2017 |
Meeting End Date: 07/13/2017 |
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Recording SEMI Standards Staff: Laura Nguyen |
CER Posted to Web: 07/24/2017 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5267 | New Standard, Specification for Microfluidic Port and Pitch Dimensions | Failed, returned to the TF for rework and reballot | |
6176 | Reapproval of SEMI MS1-0307 (Reapproved 0812), Guide to Specifying Wafer-Wafer Bonding Alignment Target | Passed, as balloted | 6176ProceduralReview.pdf |
6177 | Reapproval of SEMI MS10-0912, Test Method to Measure Fluid Permeation Through MEMS Packaging Materials | Passed, as balloted | 6177ProceduralReview.pdf |
NOTE 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
NOTE 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
# | When | TF | Details |
5267A | Cycle 6 or 7, 2017 | MEMS Microfluidics | New Standard, Specification for Microfluidic Port and Pitch Dimensions |
SNARF(s) Granted a One-Year Extension
None..
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting of the MEMS/NEMS North America TC Chapter is scheduled for Monday, November 6, at the SEMI Standards North America Fall 2017 Meetings located at SEMI Headquarters in Milpitas, California.
For more information, please visit the Standards Calendar at http://www.semi.org/en/standards.
Tentative Schedule:
Monday, November 6
13:00-13:30 Microfluidics (TF)
13:30-15:30 Joint MSIG, MEMS Substrate, and Material Characterization (TFs)
15:30-17:00 MEMS / NEMS (C)
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