SEMI International Standards
Standards Locale: China |
Committee: Compound Semiconductor Materials |
Place of Meeting: OVTCCM |
Date of Meeting: 12/14/2022 |
Meeting End Date: |
|
Recording SEMI Standards Staff: Isadora Jin |
CER Posted to Web: 12/28/2022 |
Leadership Changes
WG/TF/SC/TC Name | Previous Leader | New Leader |
Compound Semiconductor Materials |
SiC Substrate Task Force | Min LU — Perfect Crystal
Hongjun ZHENG — SPTAIKE
Fangliang YAN — MigeLab | Min LU — Perfect Crystal
Hongjun ZHENG —Perfect Crystal
Fangliang YAN — MigeLab |
HB-LED |
None | | |
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
Compound Semiconductor Materials |
6767 | Revise SNARF | Silicon Carbide Substrate Task Force | SNARF Title from: New Standard: Test Method for Flatness of Silicon Carbide Wafers by Optical Interference
To: New Standard: Test Method for GBIR, SBIR, GF3R, SFQR and SORI of Silicon Carbide Wafers by Oblique Incident Interference Method |
6769 | Revise SNARF | Silicon Carbide Substrate Task Force | SNARF Title from: New Standard: Test Method for Residual Stress of Silicon Carbide Wafers by Photoelastic
To: New Standard: Test Method Qualitative for Residual Stress of Silicon Carbide Wafers by Photoelastic |
HB-LED |
None | | | |
Authorized Ballots
# | When | TF | Details |
Compound Semiconductor Materials |
6768 | Cycle 1-23 or Cycle 2-23 | Silicon Carbide Substrate Task Force | New Standard: Test Method for Micropipe Density of Silicon Carbide Wafer by Laser Reflection |
6769 | Cycle 1-23 or Cycle 2-23 | Silicon Carbide Substrate Task Force | New Standard: Test Method Qualitative for Residual Stress of Silicon Carbide Wafers by Photoelastic |
HB-LED |
None | | | |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting of the Compound Semiconductor Materials & HB-LED China TC Chapter is scheduled for TBD, 2023, China.
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