SEMI International Standards
Standards Locale: China
Committee: HB-LED
Place of Meeting: HanJue Hotel Wuhu, No.87 North Yinhu Road, Wuhu, Anhui
Date of Meeting: 04/20/2017
Meeting End Date: 04/20/2017
Recording SEMI Standards Staff: Sophia Huang
CER Posted to Web: 05/05/2017


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5776New Standard: Test Method for Detecting Surface Defects of GaN based LED Epitaxial Wafer Used for Manufacturing HB-LEDFailed and return to TF for re-work and reballot in Cycle 5-2017


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
SC/TF/WG
Details
6192Pattern Sapphire Substrate Task ForceNew Standard: Specification for Dry etching Patterned Sapphire Substrate (DPSS)


Authorized Ballots

#
When
TF
Details
5776ACycle 5-2017 or Cycle 6-2017GaN based LED Epitaxial Wafer Task Force New Standard: Test Method for Detecting Surface Defects of GaN based LED Epitaxial Wafer Used for Manufacturing HB-LED
5723BCycle 5-2017 or Cycle 6-2017Single Crystal Sapphire Task Force New Standard: Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB- LED Wafers
5775BCycle 5-2017 or Cycle 6-2017Sapphire Single Crystal Ingot Task Force New Standard: Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers


SNARF(s) Granted a One-Year Extension

#
TF
Title
Expiration Date
5723BSingle Crystal Sapphire Task ForceNew Standard: Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB- LED Wafers2018/05/22
5775BSapphire Single Crystal Ingot Task Force New Standard: Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers2018/09/19
5776AGaN based LED Epitaxial Wafer Task Force New Standard: Test Method for Detecting Surface Defects of GaN based LED Epitaxial Wafer Used for Manufacturing HB-LED2018/09/19
5629Single Crystal Sapphire Task Force New Standard: Guide for Identification Defects on Bare Surfaces of Sapphire Wafers 2017/07/11


SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
December 12, 2017, Thursday, SEMI China Office,HB-LED Standards Winter Meeting 2017