SEMI International Standards
Standards Locale: Europe |
Committee: Compound Semiconductor Materials |
Place of Meeting: Nuremburg, Germany |
Date of Meeting: 04/10/2014 |
Meeting End Date: 04/10/2014 |
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Recording SEMI Standards Staff: Andrea Busch |
CER Posted to Web: 05/21/2014 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
# 5370 | NEW STANDARD: SPECIFICATION FOR 150 mm ROUND POLISHED MONO-CRYSTALLINE 4H AND 6H SILICON CARBIDE WAFERS to SEMI M55-0308, SPECIFICATION FOR POLISHED MONO-CRYSTALLINE SILICON CARBIDE WAFERS | Passed | Completed |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
M46, M63, M64 | 5-year-review | TF to be created | Creation of a 5-year-review Task Force to review M46, M63, M64. TFOF and SNARFs to be created in May 2014. |
.
Authorized Ballots
# | When | SC/TF/WG | Details |
#3784B | Cycle 4, 2014 | SiC TF | NEW STANDARD: SPECIFICATION FOR 100 mm ROUND POLISHED MONOCRYSTALLINE 4H AND 6H SILICON CARBIDE WAFERS to SEMI M55-0308, SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON CARBIDE WAFERS |
.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
SEMICON Europa in Grenoble, France (October 2014).
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