SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Nuremburg, Germany
Date of Meeting: 04/10/2014
Meeting End Date: 04/10/2014
Recording SEMI Standards Staff: Andrea Busch
CER Posted to Web: 05/21/2014


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
# 5370NEW STANDARD: SPECIFICATION FOR 150 mm ROUND POLISHED MONO-CRYSTALLINE 4H AND 6H SILICON CARBIDE WAFERS to SEMI M55-0308, SPECIFICATION FOR POLISHED MONO-CRYSTALLINE SILICON CARBIDE WAFERS PassedCompleted


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
M46, M63, M645-year-reviewTF to be createdCreation of a 5-year-review Task Force to review M46, M63, M64. TFOF and SNARFs to be created in May 2014.
.

Authorized Ballots

#
When
SC/TF/WG
Details
#3784BCycle 4, 2014SiC TFNEW STANDARD: SPECIFICATION FOR 100 mm ROUND POLISHED MONOCRYSTALLINE 4H AND 6H SILICON CARBIDE WAFERS to SEMI M55-0308, SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON CARBIDE WAFERS
.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
SEMICON Europa in Grenoble, France (October 2014).