SEMI International Standards
Standards Locale: North America
Committee: Traceability
Place of Meeting: San Francisco, CA
Date of Meeting: 07/10/2017
Meeting End Date: 07/10/2017
Recording SEMI Standards Staff: Inna Skvortsova
CER Posted to Web: 07/24/2017


Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
T5 Revision Task ForceNoneThomas Seldrum (Dow Corning)
Arnd Weber (SiCrystal AG)


Committee Structure Changes

Previous WG/TF/SC Name
New WG/TF/SC Name or Status Change
NoneT5 (Alphanumeric Marking of Round Compound Semiconductor Wafers) Revision Task Force (new)


Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
6061Reapproval of SEMI M12-0706 (Reapproved 1011): Specification for Serial Alphanumeric Marking of the Front Surface of WafersPassed 6061 Procedural Review.pdf6061 Procedural Review.pdf
6062Reapproval of SEMI M13-0706 (Reapproved 1011): Specification for Alphanumeric Marking of Silicon WafersPassed


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting

#
Type
SC/TF/WG
Details
n/aTFOFn/aT5 Revision Task Force
6117SNARFT5 Revision TFLine Item Revision to SEMI T5-1214, Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers
Approved by GCS 12/02/2016


Authorized Activities

#
Type
SC/TF/WG
Details
TBDSNARF5Yr ReviewReapproval of SEMI T15-0812, General Specification of Jig ID: Concept
TBDSNARF5Yr ReviewReapproval of SEMI T17-0706 (Reapproved 0812), Specification of Substrate Traceability
TBDSNARF5Yr ReviewReapproval of SEMI T18-1106 (Reapproved 0812), Specification of Parts and Components Traceability
TBDSNARF5Yr ReviewReapproval of SEMI T10-0701 (Reapproved 0912) Test Method for the Assessment of 2D Data Matrix Direct Mark Quality
Ballots to be adjudicated at Japan Chapter of Traceability TC

Authorized Ballots

#
When
TF
Details
TBDCycle 7-175Yr ReviewReapproval of SEMI T15-0812, General Specification of Jig ID: Concept
TBDCycle 7-175Yr ReviewReapproval of SEMI T17-0706 (Reapproved 0812), Specification of Substrate Traceability
TBDCycle 7-175Yr ReviewReapproval of SEMI T18-1106 (Reapproved 0812), Specification of Parts and Components Traceability
TBDCycle 7-175Yr ReviewReapproval of SEMI T10-0701 (Reapproved 0912) Test Method for the Assessment of 2D Data Matrix Direct Mark Quality


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting

Monday, July 10, 2018, San Francisco, CA

        · 5 Year Review Traceability TF (9:00 – 10:00)

        · T5 Revision TF (10:00 – 11:00) <TBD>

        · Traceability TC Chapter (11:00 – 12:00)

For more information, please visit Standards Calendar at http://www.semi.org/en/standards