SEMI International Standards
Standards Locale: North America |
Committee: Traceability |
Place of Meeting: San Francisco, CA |
Date of Meeting: 07/10/2017 |
Meeting End Date: 07/10/2017 |
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Recording SEMI Standards Staff: Inna Skvortsova |
CER Posted to Web: 07/24/2017 |
Leadership Changes
WG/TF/SC/TC Name | Previous Leader | New Leader |
T5 Revision Task Force | None | Thomas Seldrum (Dow Corning)
Arnd Weber (SiCrystal AG) |
Committee Structure Changes
Previous WG/TF/SC Name | New WG/TF/SC Name or Status Change |
None | T5 (Alphanumeric Marking of Round Compound Semiconductor Wafers) Revision Task Force (new) |
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
6061 | Reapproval of SEMI M12-0706 (Reapproved 1011): Specification for Serial Alphanumeric Marking of the Front Surface of Wafers | Passed | 6061 Procedural Review.pdf |
6062 | Reapproval of SEMI M13-0706 (Reapproved 1011): Specification for Alphanumeric Marking of Silicon Wafers | Passed | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
# | Type | SC/TF/WG | Details |
n/a | TFOF | n/a | T5 Revision Task Force |
6117 | SNARF | T5 Revision TF | Line Item Revision to SEMI T5-1214, Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers
Approved by GCS 12/02/2016 |
Authorized Activities
# | Type | SC/TF/WG | Details |
TBD | SNARF | 5Yr Review | Reapproval of SEMI T15-0812, General Specification of Jig ID: Concept |
TBD | SNARF | 5Yr Review | Reapproval of SEMI T17-0706 (Reapproved 0812), Specification of Substrate Traceability |
TBD | SNARF | 5Yr Review | Reapproval of SEMI T18-1106 (Reapproved 0812), Specification of Parts and Components Traceability |
TBD | SNARF | 5Yr Review | Reapproval of SEMI T10-0701 (Reapproved 0912) Test Method for the Assessment of 2D Data Matrix Direct Mark Quality |
Ballots to be adjudicated at Japan Chapter of Traceability TC
Authorized Ballots
# | When | TF | Details |
TBD | Cycle 7-17 | 5Yr Review | Reapproval of SEMI T15-0812, General Specification of Jig ID: Concept |
TBD | Cycle 7-17 | 5Yr Review | Reapproval of SEMI T17-0706 (Reapproved 0812), Specification of Substrate Traceability |
TBD | Cycle 7-17 | 5Yr Review | Reapproval of SEMI T18-1106 (Reapproved 0812), Specification of Parts and Components Traceability |
TBD | Cycle 7-17 | 5Yr Review | Reapproval of SEMI T10-0701 (Reapproved 0912) Test Method for the Assessment of 2D Data Matrix Direct Mark Quality |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Monday, July 10, 2018, San Francisco, CA
For more information, please visit Standards Calendar at http://www.semi.org/en/standards
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