SEMI International Standards
Standards Locale: North America |
Committee: Traceability |
Place of Meeting: San Jose, CA |
Date of Meeting: 11/02/2015 |
Meeting End Date: 11/02/2015 |
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Recording SEMI Standards Staff: Laura Nguyen |
CER Posted to Web: 11/04/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5920 | Reapproval of SEMI T16-0310, Specification for Use of Data Matrix Symbology for Automated Identification of Extreme Ultraviolet Lithography Masks | Passed | 5920ProceduralReview.docx |
5922 | Reapproval of SEMI T20-0710: Specification for Authentication of Semiconductors and Related Products; SEMI T20.1-1109, Specification for Object Labeling to Authenticate Semiconductors and Related Products in an Open Market; SEMI T20.2-1109, Guide for Qualifications of Authentication Service Bodies for Detecting and Preventing Counterfeiting of Semiconductors and Related Products, and SEMI T20.3-0710, Specification for Service Communication for Authentication of Semiconductors and Related Products | Passed | 5922ProceduralReview.docx |
5923 | Reapproval of SEMI T8-1110, Specification for Marking of Glass Flat Panel Display Substrates with a Two-dimensional Matrix Code Symbol | Passed | 5923ProceduralReview.docx |
5924 | Reapproval of SEMI T9-1110, Specification for Marking of Metal Lead-frame Strips with a Two-dimensional Data Matrix Code Symbol | Passed | 5924ProceduralReview.docx |
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Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
TBD
For more information, please visit: http://www.semi.org/standards
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