SEMI International Standards
Standards Region: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Munich, Germany
Date of Meeting: 11/21/2019
Recording SEMI Standards Staff: James Amano
CER Posted to Web: 11/21/2019


Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
SiC Material and Wafer Specification TFTom Barbieri (Cree) joins Arnd Weber (SiCrystal) as co-leader


Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
6474Revision to SEMI M82-0813: Test Method for the Carbon Acceptor Concentration in Semi-Insulating Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Passed
6546Revision to SEMI M83-0913 Test Method For Determination Of Dislocation Etch Pit Density In Monocrystals Of III-V Compound Semiconductors Passed



Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
TBDSNARFSiC Material and Wafer Specification TFRevision of SEMI M55-0817, Specification for Polished Monocrystalline Silicon Carbide Wafers


Authorized Ballots
None.


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Abolished
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
In conjunction with SEMICON Europa 2020 in Munich, Germany. Check the events page at https://www.semi.org/en/collaborate/standards for details.