SEMI International Standards
Standards Locale: Europe |
Committee: Silicon Wafer |
Place of Meeting: Dresden, Germany |
Date of Meeting: 10/07/2015 |
Meeting End Date: 10/07/2015 |
|
Recording SEMI Standards Staff: James Amano |
CER Posted to Web: 10/15/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
4812 | SNARF | International Advanced Wafer Geometry Task Force | New Standard:Guide for Flatness Measurement on 450 mm Wafers. As part of the three-year SNARF review, this SNARF was abolished. |
5893 | SNARF | International Polished Wafers Task Force | This revision of SEMI M1 is intended primarily to remove the listing of wafer categories in the Scope section so that modifications of this listing can be made with line item ballots and other items to bring the standard up to date. |
Authorized Ballots
# | When | SC/TF/WG | Details |
5893 | Cycle 8-2015 | International Polished Wafers Task Force | This revision of SEMI M1 is intended primarily to remove the listing of wafer categories in the Scope section so that modifications of this listing can be made with line item ballots and other items to bring the standard up to date. |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
October 2016 in conjunction with SEMICON Europa in Grenoble, France. Date and time, when available, will be posted to http://www.semi.org/en/Standards/CalendarEvents
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