SEMI International Standards
Standards Locale: North America |
Committee: Traceability |
Place of Meeting: San Francisco Marriott Marquis Hotel in San Francisco, California |
Date of Meeting: 07/10/2014 |
Meeting End Date: 07/10/2014 |
|
Recording SEMI Standards Staff: Michael Tran |
CER Posted to Web: 07/17/2014 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5612 | Reapproval of SEMI T7-0303 (Reapproved 0709), Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol | Failed committee review and returned to the TF for rework | 5612BallotReviewSummary.doc |
5613 | Reapproval of SEMI T11-0703 (Reapproved 0709), Specification for Marking of Hard Surface Reticle Substrates | Passed committee review. Superclean | 5613ProceduralReview.doc |
5689 | Line Item Revision of SEMI T5-1106 (Reapproved 1111), Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers | | 5689ProceduralReview.doc |
Line item 1 | Update table 1 by adding Back Surface for 150 mm wafer | Passed committee review. Superclean | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
# | Type | SC/TF/WG | Details |
5752 | SNARF | 5 Year Review TF | Revision of SEMI T7-0303 (Reapproved 0709), Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol |
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
Listing of documents approved by the committee for letter ballot.
# | When | SC/TF/WG | Details |
5752 | Cycle 7, 2014 | 5 Year Review TF | Revision of SEMI T7-0303 (Reapproved 0709), Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol
To be adjudicated at the next Japan Traceability TC Chapter meeting in 2014 pending GCS approval |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next N.A. Traceability standards meetings are tentatively scheduled for July 16, 2015 at the San Francisco Marriott Marquis Hotel in San Francisco, California in conjunction with SEMICON West 2015. Exact meeting date and details will be announced when finalized and available at the SEMI Calendar of Events: http://www.semi.org/Standards/CalendarEvents
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