SEMI International Standards
Standards Locale: North America
Committee: Traceability
Place of Meeting: San Francisco Marriott Marquis Hotel in San Francisco, California
Date of Meeting: 07/10/2014
Meeting End Date: 07/10/2014
Recording SEMI Standards Staff: Michael Tran
CER Posted to Web: 07/17/2014


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5612Reapproval of SEMI T7-0303 (Reapproved 0709), Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code SymbolFailed committee review and returned to the TF for rework5612BallotReviewSummary.doc5612BallotReviewSummary.doc
5613Reapproval of SEMI T11-0703 (Reapproved 0709), Specification for Marking of Hard Surface Reticle SubstratesPassed committee review. Superclean5613ProceduralReview.doc5613ProceduralReview.doc
5689Line Item Revision of SEMI T5-1106 (Reapproved 1111), Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers5689ProceduralReview.doc5689ProceduralReview.doc
Line item 1Update table 1 by adding Back Surface for 150 mm waferPassed committee review. Superclean



Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
#
Type
SC/TF/WG
Details
5752SNARF5 Year Review TFRevision of SEMI T7-0303 (Reapproved 0709), Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF


Authorized Ballots
Listing of documents approved by the committee for letter ballot.
#
When
SC/TF/WG
Details
5752Cycle 7, 20145 Year Review TFRevision of SEMI T7-0303 (Reapproved 0709), Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol

To be adjudicated at the next Japan Traceability TC Chapter meeting in 2014 pending GCS approval


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next N.A. Traceability standards meetings are tentatively scheduled for July 16, 2015 at the San Francisco Marriott Marquis Hotel in San Francisco, California in conjunction with SEMICON West 2015. Exact meeting date and details will be announced when finalized and available at the SEMI Calendar of Events: http://www.semi.org/Standards/CalendarEvents