SEMI International Standards
Standards Locale: North America |
Committee: Traceability |
Place of Meeting: OVTCCM |
Date of Meeting: 02/24/2021 |
Meeting End Date: 02/24/2021 |
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Recording SEMI Standards Staff: Michelle Sun |
CER Posted to Web: 03/17/2021 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
# | Type | SC/TF/WG | Details |
6448 | Ballot | EMT Task Force | Authorize Ballot for Cycle-2021 for Document 6448: New Standard: Specification Equipment and Material Labels |
6698 | SNARF | 5 Year Review Task Force | SNARF for Revision of SEMI M12-0706 (reapproved 0318), Specification for Serial Alphanumeric Marking of the Front Surface of Wafers, with title change to: Specification for Alphanumeric Marking of Wafers |
6699 | SNARF | 5 Year Review Task Force | SNARF for Revision of SEMI M13-0706 (reapproved 0318), Specification for Alphanumeric Marking of Silicon Wafers (Subject: adding alphanumeric marking at back surface in addition to front surface.) |
Authorized Activities
# | Type | SC/TF/WG | Details |
6741 | 5-year Review | 5 Year Review Task Force | Reapproval for SEMI T9-1110 (Reapproved 0216): Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol |
6740 | 5-year Review | 5 Year Review Task Force | Reapproval for SEMI T8-1110 (Reapproved 0216): Specification for Marking of Glass Flat Panel Display Substrates with a Two-Dimensional Matrix Code Symbol |
6738 | 5-year Review | 5 Year Review Task Force | Reapproval for SEMI T16-0310 (Reapproved 0216): Specification for Use of Data Matrix Symbology for Automated Identification of Extreme Ultraviolet Lithography Masks |
6739 | 5-year Review | 5 Year Review Task Force | Reapproval for SEMI T20-0710 (Reapproved 0416): Specification for Authentication of Semiconductors and Related Products |
6742 | 5-year Review | 5 Year Review Task Force | Reapproval for SEMI T7-0516: Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol |
Authorized Ballots
# | When | TF | Details |
6604A | Cycle 4 or 5 of 2021 | 5 Year Review Task Force | Line Item Revision to SEMI T5-1214: Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers |
6741 | Cycle 4 or 5 of 2021 | 5 Year Review Task Force | Reapproval for SEMI T9-1110 (Reapproved 0216): Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol |
6740 | Cycle 4 or 5 of 2021 | 5 Year Review Task Force | Reapproval for SEMI T8-1110 (Reapproved 0216): Specification for Marking of Glass Flat Panel Display Substrates with a Two-Dimensional Matrix Code Symbol |
6738 | Cycle 4 or 5 of 2021 | 5 Year Review Task Force | Reapproval for SEMI T16-0310 (Reapproved 0216): Specification for Use of Data Matrix Symbology for Automated Identification of Extreme Ultraviolet Lithography Masks |
6739 | Cycle 4 or 5 of 2021 | 5 Year Review Task Force | Reapproval for SEMI T20-0710 (Reapproved 0416): Specification for Authentication of Semiconductors and Related Products |
6742 | Cycle 4 or 5 of 2021 | 5 Year Review Task Force | Reapproval for SEMI T7-0516: Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next NA Traceability TC Chapter will be on April 7, 2021 via Online Conference.
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