SEMI International Standards
Standards Locale: North America
Committee: Flexible Hybrid Electronics (FHE)
Place of Meeting: OVTCCM
Date of Meeting: 09/18/2023
Meeting End Date: 09/18/2023
Recording SEMI Standards Staff: Laura Nguyen
CER Posted to Web: 10/02/2023
Leadership Changes
WG/TF/SC/TC Name | Previous Leader | New Leader |
| FHE NA TC Chapter [Approved at the NARSC SEMICON West Meeting] | -- | Randy Parker (American Semiconductor Inc.)
Ahmed Busnaina (Northeastern University) |
| FHE Assembly Task Force [New] | -- | Jarrid Wittkopf (HP)
John Williams (Boeing) |
| FHE Design Task Force [New] | -- | Deepak Trivedi (GE Aerospace)
Steve Gonya (Binghamton University) |
| FHE Inks Characterization Task Force [New] | -- | Kurt Christenson (Optomec)
Ahmed Busnaina (Northeastern University)
Dan Slep (ChemCubed) |
| FHE Reliability and Testing Task Force [New] | -- | Pradeep Lall (AU)
Giorgio Bazzan (AFRL) |
TC Chapter Structure Changes
Previous WG/TF/SC Name | New WG/TF/SC Name or Status Change |
| None | FHE Assembly Task Force [New] |
| None | FHE Design Task Force [New] |
| None | FHE Inks Characterization Task Force [New] |
| None | FHE Reliability and Testing Task Force [New] |
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
Listing of all revised or new SNARF(s) approved by the Originating TC Chapter.
# | Type | SC/TF/WG | Details |
-- | TFOF | TF | FHE Assembly Task Force [New] |
-- | TFOF | TF | FHE Design Task Force [New] |
-- | TFOF | TF | FHE Inks Characterization Task Force [New] |
-- | TFOF | TF | FHE Reliability and Testing Task Force [New] |
Note 1: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting has not been scheduled. Please check www.semi.org/standards for updates.
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