SEMI International Standards
Standards Locale: North America
Committee: Metrics
Place of Meeting: SEMI Headquarters in San Jose, California
Date of Meeting: 11/05/2014
Meeting End Date: 11/05/2014
Recording SEMI Standards Staff: Michael Tran
CER Posted to Web: 11/20/2014


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the TC Chapter.
#
Type
SC/TF/WG
Details
5819SNARFNA Metrics
TC Chapter		Reapproval of SEMI E114-0302E (Reapproved 0309) - Test Method for RF Cable Assemblies Used in Semiconductor Processing Equipment RF Power Delivery Systems
5820SNARFNA Metrics
TC Chapter		Reapproval of SEMI E115-0302E (Reapproved 0309) - Test Method for Determining the Load Impedance and Efficiency of Matching Networks Used in Semiconductor Processing Equipment RF Power Delivery Systems
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots
Listing of documents approved by the TC Chapter for letter ballot.
#
When
SC/TF/WG
Details
5819Cycle 1 or 2, 2015NA Metrics
TC Chapter		Reapproval of SEMI E114-0302E (Reapproved 0309) - Test Method for RF Cable Assemblies Used in Semiconductor Processing Equipment RF Power Delivery Systems
5820Cycle 1 or 2, 2015NA Metrics
TC Chapter		Reapproval of SEMI E115-0302E (Reapproved 0309) - Test Method for Determining the Load Impedance and Efficiency of Matching Networks Used in Semiconductor Processing Equipment RF Power Delivery Systems
5750Cycle 1 or 2, 2015Wait Time Waste TFRevision to Add a New Subordinate Standard: Specification for Product Time Measurement for Material Control Systems to SEMI E168-XX14, Specification for Product Time Measurement
Awaiting publication of Document 5682
5751Cycle 1 or 2, 2015Wait Time Waste TFRevision to Add a New Subordinate Standard: Specification for Product Time Measurement for Transport Systems to SEMI E168-XX14, Specification for Product Time Measurement
Awaiting publication of Document 5682


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next N.A. Metrics standards meetings are tentatively scheduled for March 30 – April 1, 2015 at SEMI Headquarters in San Jose, California in conjunction with the NA Standards Spring 2015 Meetings. Exact meeting date and details will be announced when finalized and available at the SEMI Standards Calendar of Events: http://www.semi.org/en/Standards/CalendarEvents

*Tentative Schedule*

Monday, March 30*
-Wait Time Waste TF (3:00 PM - 6:00 PM)

Tuesday, March 31*
· Equipment T&D TF (9:00 AM – 12:00 PM Noon)
· EMC TF (5:00 PM – 7:00 PM)

Wednesday, April 1*
· Equipment RAMP Metrics TF (9:00 AM – 12:00 PM Noon)
· N.A. Metrics TC Chapter (2:00 PM – 5:00 PM)

*All times are in Pacific Time. Times and dates are subject to change without notice.