SEMI International Standards
Standards Locale: Japan |
Committee: Photovoltaic (PV) - Materials |
Place of Meeting: SEMI Japan office, Tokyo |
Date of Meeting: 12/10/2014 |
Meeting End Date: 12/10/2014 |
|
Recording SEMI Standards Staff: Chie Yanagisawa |
CER Posted to Web: 03/27/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
Receipt of the LOA related to Doc. 5532 New Standard: “Test Method for Measurement of Cracks in PV Silicon Wafers in PV Modules by Laser Scanning” was reported to the Japan TC Chapter of PV Materials Global Technical Committee and the TC Chapter confirmed the LOA at the meeting on December 10, 2014.
Next Meeting
TBD
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