SEMI International Standards
Standards Locale: Japan
Committee: Photovoltaic (PV) - Materials
Place of Meeting: SEMI Japan, Tokyo
Date of Meeting: 07/04/2014
Meeting End Date: 07/04/2014
Recording SEMI Standards Staff: Chie Yanagisawa
CER Posted to Web: 07/18/2014


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5532New Standard: Test Method for Measurement of Cracks in PV Silicon Wafers in PV Modules by Laser ScanningPassed with editorial changesA&R_5532.pdf
It turned out after the meeting that the LOA has not obtained yet. So, the part of “VIII Intellectual Property Check” of the procedural review should be reviewed after the LOA is submitted to the TC meeting.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
Since the same topic as SNARF #5417, New Standard: Test Method for Measurement of Defects in PV Silicon Wafers in PV Modules by Electroluminescence Imaging, has been under development at IEC (International Electrotechnical Commission), Japan PV Materials task force proposed withdrawal of SNARF #5417, which was approved at this meeting on July 4.

Next Meeting
The next PV/PV Materials Japan TC Chapters joint meeting will be held on 13:30-17:00, Thursday, September 11, 2014 at SEMI Japan Office, Tokyo, Japan. .