SEMI International Standards
Standards Locale: North America |
Committee: HB-LED |
Place of Meeting: San Francisco Marriott Marquis Hotel in San Francisco, California |
Date of Meeting: 07/10/2014 |
Meeting End Date: 07/10/2014 |
|
Recording SEMI Standards Staff: Michael Tran |
CER Posted to Web: 07/15/2014 |
Leadership Changes
Group | Previous Leader | New Leader |
Test Methods TF (New Task Force) | | Peter Wagner (Self) |
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
# | Type | SC/TF/WG | Details |
--- | TFOF | NA HB-LED TC Chapter | Test Methods TF (New Task Force) |
5741 | SNARF | HB-LED Wafer TF | Line item revisions to SEMI HB1-XX14, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
Awaiting publication of Document 5684 |
5747 | SNARF | Test Methods TF | New Standard: Test Method for Measurement of Saw Marks on Crystalline Sapphire Wafers Using Optical Probes |
5748 | SNARF | Test Methods TF | New Standard: Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers Using Optical Probes |
5749 | SNARF | Test Methods TF | New Standard: Test Method for Measurement of Waviness of Crystalline Sapphire Wafers Using Optical Probes |
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
Listing of documents approved by the committee for letter ballot.
# | When | SC/TF/WG | Details |
5741 | Cycle 6, 2014 | HB-LED Wafer TF | Line item revisions to SEMI HB1-XX14, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
Awaiting publication of Document 5684 before Cycle 6,2014 |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next NA Standards HB-LED Meetings will be held on November 6, 2014 in conjunction with the NA Standards Fall 2014 Meetings at SEMI Headquarters in San Jose, California. Exact meeting dates and details as they become available will be posted here: http://www.semi.org/en/node/50511
*Tentative Schedule*
Thursday, November 6*
· HB-LED Equipment Communication Interfaces TF (09:00 AM - 2:30 PM)
· HB-LED Wafer TF / Impurities & Defects TF (08:00 AM - 12:00 PM)
· NA HB-LED Technical Committee Chapter (2:00 PM - 5:00 PM)
*All times are in PDT. Times and dates are subject to change without notice.
For meeting details, registration, the latest schedule, and travel information please visit
http://www.semi.org/en/node/50511
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