SEMI International Standards
Standards Locale: China
Committee: Compound Semiconductor Materials
Place of Meeting: ICC, Shanghai, China.
Date of Meeting: 03/16/2021
Meeting End Date: 03/16/2021
Recording SEMI Standards Staff: Isadora Jin
CER Posted to Web: 03/25/2021


Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
Compound Semiconductor Materials
None
HB-LED
None
Committee Structure Changes

Previous WG/TF/SC Name
New WG/TF/SC Name or Status Change
Compound Semiconductor Materials
None
HB-LED
None
Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
Compound Semiconductor Materials
None
HB-LED
6589Revision to SEMI HB4-0913 (Reapproved 0419) Specification of Communication Interfaces for High Brightness Led Manufacturing Equipment (HB-LED ECI)Passed with Technical Changes.
Ratification ballot to be issued.		A&R Form_ 6589.pdf


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting

#
Type
SC/TF/WG
Details
Compound Semiconductor Materials
SNARFSiC Substrate TFNew Standard: Test Method for Micropipe Density of Silicon Carbide Wafer By Laser Reflection
SNARFSiC Substrate TFNew Standard: Test Method for Flatness of Silicon Carbide Wafers by Optical Interference
SNARFSiC Substrate TFNew Standard: Test Method for Residual Stress of Silicon Carbide Wafers by Photoelastic
HB-LED
None
Authorized Activities

#
Type
SC/TF/WG
Details
Compound Semiconductor Materials
SNARFSiC Substrate TFNew Standard: Test Method for Micropipe Density of Silicon Carbide Wafer By Laser Reflection
SNARFSiC Substrate TFNew Standard: Test Method for Flatness of Silicon Carbide Wafers by Optical Interference
SNARFSiC Substrate TFNew Standard: Test Method for Residual Stress of Silicon Carbide Wafers by Photoelastic
HB-LED
None
Authorized Ballots

#
When
TF
Details
Compound Semiconductor Materials
None
HB-LED
6371CCycle 4-21 or Cycle 5-21Patterned Sapphire Substrate TFNew Standard: Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate


SNARF(s) Granted a One-Year Extension

#
TF
Title
Expiration Date
Compound Semiconductor Materials
None
HB-LED
6371Patterned Sapphire Substrate TFNew Standard: Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate2022/04/18


SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status

Standard Designation
Title
Compound Semiconductor Materials
None
HB-LED
None
Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
TBD, 2021, China. Check www.semi.org/standards for latest information