SEMI International Standards
Standards Locale: Europe |
Committee: Compound Semiconductor Materials |
Place of Meeting: Berlin, Germany |
Date of Meeting: 04/15/2015 |
Meeting End Date: 04/15/2015 |
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Recording SEMI Standards Staff: Andrea Busch |
CER Posted to Web: 07/10/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action |
5732 | TEST METHOD FOR MEASURING THE Al FRACTION IN AlGaAs ON GaAs SUBSTRATES BY HIGH RESOLUTION X-RAY DIFFRACTION | Passed |
5733 | TEST METHOD FOR MEASURING CARRIER CONCENTRATIONS IN EPITAXIAL LAYER STRUCTURES BY ECV PROFILING | Passed |
5734 | TEST METHOD FOR THE EL2 DEEP DONOR CONCENTRATION IN SEMI-INSULATING (SI) GALLIUM ARSENIDE SINGLE CRYSTALS BY INFRARED ABSORPTION SPECTROSCOPY | Passed |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
# | When | SC/TF/WG | Details |
5795 | Cycle 4-2015 | | Ballot was already authorized at the meeting in Oct 2014 in Freiberg. Alleged copyright questions were also discussed at ERSC meeting and the approval of the unchanged document for ballot is confirmed. |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
SEMICON Europe 2015 in Dresden Germany, October 7, 11am-1pm
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