SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Berlin, Germany
Date of Meeting: 04/15/2015
Meeting End Date: 04/15/2015
Recording SEMI Standards Staff: Andrea Busch
CER Posted to Web: 07/10/2015


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
5732TEST METHOD FOR MEASURING THE Al FRACTION IN AlGaAs ON GaAs SUBSTRATES BY HIGH RESOLUTION X-RAY DIFFRACTIONPassed
5733TEST METHOD FOR MEASURING CARRIER CONCENTRATIONS IN EPITAXIAL LAYER STRUCTURES BY ECV PROFILINGPassed
5734TEST METHOD FOR THE EL2 DEEP DONOR CONCENTRATION IN SEMI-INSULATING (SI) GALLIUM ARSENIDE SINGLE CRYSTALS BY INFRARED ABSORPTION SPECTROSCOPYPassed


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots

#
When
SC/TF/WG
Details
5795Cycle 4-2015Ballot was already authorized at the meeting in Oct 2014 in Freiberg. Alleged copyright questions were also discussed at ERSC meeting and the approval of the unchanged document for ballot is confirmed.


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
SEMICON Europe 2015 in Dresden Germany, October 7, 11am-1pm