SEMI International Standards
Standards Locale: North America |
Committee: Traceability |
Place of Meeting: San Francisco, CA |
Date of Meeting: 07/11/2016 |
Meeting End Date: 07/11/2016 |
|
Recording SEMI Standards Staff: Inna Skvortsova |
CER Posted to Web: 07/25/2016 |
Leadership Changes
Group | Previous Leader | New Leader |
5Yr Review TF | Liaison with Silicon Wafer TC | Masanori Yoshise |
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Committee Structure Changes
None.
Ballot Results
None
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
Authorized Activities
# | Type | SC/TF/WG | Details |
5614 | SNARF | 5 Year Review TF | Revision of SEMI T3, Specification for Wafer Box Labels (Re:to extend application to other symbologies and Near-Field Communication)
SNARF abolished. |
TBD | SNARF | 5Yr Review TF | Reapproval of SEMI M12-0706: Specification for Serial Alphanumeric Marking of the Front Surface of Wafers; (including intercommittee ballot to Silicon Wafer TC) |
TBD | SNARF | 5Yr Review TF | Reapproval of SEMI M13-0706: Specification for Alphanumeric Marking of Silicon Wafers; (including intercommittee ballot to Silicon Wafer TC) |
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Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Monday, July 10 2017, SEMICON West, San Francisco CA
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