SEMI International Standards
Standards Locale: North America
Committee: Traceability
Place of Meeting: San Francisco, CA
Date of Meeting: 07/11/2016
Meeting End Date: 07/11/2016
Recording SEMI Standards Staff: Inna Skvortsova
CER Posted to Web: 07/25/2016


Leadership Changes

Group
Previous Leader
New Leader
5Yr Review TFLiaison with Silicon Wafer TCMasanori Yoshise
.

Committee Structure Changes
None.

Ballot Results
None

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

Authorized Activities
#
Type
SC/TF/WG
Details
5614SNARF5 Year Review TFRevision of SEMI T3, Specification for Wafer Box Labels (Re:to extend application to other symbologies and Near-Field Communication)
SNARF abolished.
TBDSNARF5Yr Review TFReapproval of SEMI M12-0706: Specification for Serial Alphanumeric Marking of the Front Surface of Wafers; (including intercommittee ballot to Silicon Wafer TC)
TBDSNARF5Yr Review TFReapproval of SEMI M13-0706: Specification for Alphanumeric Marking of Silicon Wafers; (including intercommittee ballot to Silicon Wafer TC)
.

Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting

    Monday, July 10 2017, SEMICON West, San Francisco CA
        · 5 Year Review Traceability TF (9:00 – 11:00)

        · Traceability TC Chapter (11:00 – 12:00).