SEMI International Standards
Standards Locale: Japan |
Committee: Silicon Wafer |
Place of Meeting: Tokyo, Japan |
Date of Meeting: 09/18/2015 |
Meeting End Date: 09/18/2015 |
|
Recording SEMI Standards Staff: Junko Collins |
CER Posted to Web: 10/02/2015 |
Leadership Changes
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5877 | Revision to SEMI M80-0514, Mechanical Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers with title change to: Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers | Passed as balloted
Superclean | 5877_Ballot report on Sep. 18_R0.1.pdf |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5770 | SNARF | International Test Method TF | Test Methods for Bulk micro defect density and denuded zone width in annealed silicon wafers. ⇒ Guide for measuring bulk micro defect density and denuded zone width in annealed silicon wafers.
Note: 2 weeks Global TC members' review process was done before this meeting. |
TBD | SNARF | International Test Method TF | TEST METHOD FOR RECOMBINATION LIFETIME OF THE EPILAYER OF THE SILICON EPITAXIAL WAFER (p/p+, n/n+) BY THE SHORT WAVELENGTH EXCITAION MICROWAVE PHOTOCONDUCTIVE DECAY METHOD”
Note: 2 weeks Global TC members' review process was done before this meeting. |
5774 | SNARF | International Test Method TF | Revision of the SNARF with Title change, Test Method for Sample Preparation Methods for Minority Carrier Diffusion Length Measurements in Silicon Wafers by Surface Photovoltage Methods
Guide for Sample Preparation Methods for Minority Carrier Diffusion Length Measurements in Silicon Wafers by Surface Photovoltage Methods
Note: 2 weeks Global TC members' review process will be needed. |
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
December 17, Thursday, 2015 in conjunction with SEMICON Japan 2015, 09:00-17:00 at the meeting room in Conference Tower, Tokyo Big Sight.
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