SEMI International Standards
Standards Locale: North America |
Committee: Traceability |
Place of Meeting: SEMI HQ, Milpitas, CA |
Date of Meeting: 11/07/2019 |
Meeting End Date: 11/07/2019 |
|
Recording SEMI Standards Staff: Inna Skvortsova |
CER Posted to Web: 11/13/2019 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
6471A
Line Item 1 | Line Item Revision to SEMI T23-0119: Specification for Single Device Traceability for the Supply Chain
Line Item 1 – Improve clarity on carrier objects and identifiers | Passed | |
6471A
Line Item 2 | Line Item Revision to SEMI T23-0119: Specification for Single Device Traceability for the Supply Chain
Line Item 2 – Add a Compliance Statement and Table | Passed |
SEMI T23-0119 | Specification for Single Device Traceability for the Supply Chain
(Unballoted Type II editorial change for handling trademarks) | Passed | |
Note 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Note 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
6604 | SNARF | 5Year Review | Line Item Revision to SEMI T5-1214: Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers
New SNARF distributed for 2-week member review and approved at TC meeting |
6605 | SNARF | 5Year Review | Reapproval to SEMI T11-0703 (Reapproved 1014): Specification for Marking of Hard Surface Reticle Substrates
New SNARF approved at TC |
Authorized Ballots
# | When | TF | Details |
6604 | Cycle 1 or 2 2020 | 5 Year Review TF | Line Item Revision to SEMI T5-1214: Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers |
6605 | Cycle 1 or 2 2020 | 5 Year Review TF | Reapproval to SEMI T11-0703 (Reapproved 1014): Specification for Marking of Hard Surface Reticle Substrates |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Monday March 30, 2020, SEMI HQ Milpitas CA
· 5 Year Review TF (8:30AM – 9:30AM Pacific Time)
· Equipment and Materials Traceability TF (9:30 AM – 10:30AM Pacific Time)
· Single Device Traceability TF (11:00AM – 12:00 noon Pacific Time)
· Traceability TC Chapter (14:00 PM – 16:00 PM Pacific Time)
For more information, please visit Standards Calendar at http://www.semi.org/en/standards
Copyright ©2024 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.