# | Type | SC/TF/WG | Details |
5915 | SNARF | Int'l Advanced Wafer Geometry TF | Line Item Revision to SEMI M1-0215, Addition to Related Information : Illustration of Flatness and Shape Metrics for Silicon Wafers
(SNARF was revised) |
6041 | SNARF | Int'l Advanced Wafer Geometry TF | Line Item Revision to M21-1110 Guide For Assigning Addresses To Rectangular Elements In A Cartesian Array |
6042 | SNARF | Int'l Test Methods TF | Line Item Revision to SEMI MF1763-0706 (Reapproved 1111)Test Methods for Measuring Contrast of a Linear Polarizer
(Title correction for conformance) |
6043 | SNARF | Int'l Test Methods TF | Line Item Revision to SEMI MF28-0707 (Reapproved 0912) Test Methods for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
(Title correction for conformance) |
6044 | SNARF | Int'l Test Methods TF | Line Item Revision to SEMI MF673-1014 Test Methods For Measuring Resistivity Of Semiconductor Wafers Or Sheet Resistance Of Semiconductor Films With A Noncontact Eddy-current Gauge
(Title correction for conformance) |
6045 | SNARF | Int'l Test Methods TF | Line Item Revision to SEMI MF928-1014 Test Methods For Edge Contour Of Circular Semiconductor Wafers And Rigid Disk Substrates
(Title correction for conformance) |
6046 | SNARF | Int'l Test Methods TF | Line Item Revision to SEMI MF1982-0714 Test Methods For Analyzing Organic Contaminants On Silicon Wafer Surfaces By Thermal Desorption Gas Chromatography
(Title correction for conformance) |
6047 | SNARF | Int'l Test Methods TF | Reapproval of SEMI MF728-1106 (Reapproved 1111) Practice for Preparing an Optical Microscope for Dimensional Measurements |
6048 | SNARF | Int'l Test Methods TF | Reapproval of SEMI MF978-1106 (Reapproved 1111)Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques |
# | When | SC/TF/WG | Details |
5995 | Cycle 6-15 | Int'l Automated Advance Surface Inspection T | Line Item Revision of SEMI MF1048-1111 TEST METHOD FOR MEASURING REFLECTIVE TOTAL INTEGRATED SCATTER |
6042 | Cycle 6-15 | Int'l Test Methods TF | Line Item Revision to SEMI MF1763-0706 (Reapproved 1111)Test Methods for Measuring Contrast of a Linear Polarizer
(Title correction for conformance) |
6043 | Cycle 6-15 | Int'l Test Methods TF | Line Item Revision to SEMI MF28-0707 (Reapproved 0912) Test Methods for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
(Title correction for conformance) |
6044 | Cycle 6-15 | Int'l Test Methods TF | Line Item Revision to SEMI MF673-1014 Test Methods For Measuring Resistivity Of Semiconductor Wafers Or Sheet Resistance Of Semiconductor Films With A Noncontact Eddy-current Gauge
(Title correction for conformance) |
6045 | Cycle 6-15 | Int'l Test Methods TF | Line Item Revision to SEMI MF928-1014 Test Methods For Edge Contour Of Circular Semiconductor Wafers And Rigid Disk Substrates
(Title correction for conformance) |
6046 | Cycle 6-15 | Int'l Test Methods TF | Line Item Revision to SEMI MF1982-0714 Test Methods For Analyzing Organic Contaminants On Silicon Wafer Surfaces By Thermal Desorption Gas Chromatography
(Title correction for conformance) |
6047 | Cycle 6-15 | Int'l Test Methods TF | Reapproval of SEMI MF728-1106 (Reapproved 1111) Practice for Preparing an Optical Microscope for Dimensional Measurements |
6048 | Cycle 6-15 | Int'l Test Methods TF | Reapproval of SEMI MF978-1106 (Reapproved 1111)Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques |