SEMI International Standards
Standards Locale: Europe |
Committee: Compound Semiconductor Materials |
Place of Meeting: Nuremburg, Germany |
Date of Meeting: 04/27/2017 |
Meeting End Date: 04/27/2017 |
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Recording SEMI Standards Staff: James Amano |
CER Posted to Web: 04/27/2017 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
4689 | Revision of SEMI M55-0315, Specification for Polished Monocrystalline Silicon Carbide Wafers | Passed | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
# | When | TF | Details |
6015 | Cycle 5, 6, or 7-2017 | SiC Material and Wafer Specification TF | Line Item Revision SEMI M81-0611 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
In conjunction with SEMICON Europa 2017, November 14 - 17 in Munich, Germany. Details, when available, will be posted to http://www.semi.org/en/standards-events
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