SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Nuremburg, Germany
Date of Meeting: 04/27/2017
Meeting End Date: 04/27/2017
Recording SEMI Standards Staff: James Amano
CER Posted to Web: 04/27/2017


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
4689Revision of SEMI M55-0315, Specification for Polished Monocrystalline Silicon Carbide WafersPassed


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots

#
When
TF
Details
6015Cycle 5, 6, or 7-2017SiC Material and Wafer Specification TFLine Item Revision SEMI M81-0611 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
In conjunction with SEMICON Europa 2017, November 14 - 17 in Munich, Germany. Details, when available, will be posted to http://www.semi.org/en/standards-events