SEMI International Standards
Standards Locale: Japan
Committee: 3D Packaging and Integration
Place of Meeting: SEMI Japan office, Tokyo, Japan
Date of Meeting: 07/24/2017
Meeting End Date: 07/24/2017
Recording SEMI Standards Staff: Chie Yanagisawa
CER Posted to Web: 08/01/2017


Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
1st Chair personKazunori Kato (AiT)
2nd Chair personHaruo Shimamoto (AIST)
3rd Chair personMasahiro Tsuriya (iNEMI)
1st GCS memberKazunori Kato (AiT)
2nd GCS memberMasahiro Tsuriya (iNEMI)


Committee Structure Changes

Previous WG/TF/SC Name
New WG/TF/SC Name or Status Change
*3DS-IC GTC and Assembly & Packaging GTC was transformed into a unified GTC named 3D Packaging and Integration GTC. Each TF/SG under the Japan TC Chapters of both GTCs are inherited as they are under 3D Packaging and Integration Japan TC Chapter.
JA 450mm ATDP TF under A&P Japan TC ChapterJA 450mm ATDP TF
Thin Chip Handling TF under A&P Japan TC ChapterThin Chip Handling TF
Packaging 5 Year Review TF under A&P Japan TC ChapterPackaging 5 Year Review TF
Steering Group under 3DS-IC Japan TC ChapterSteering Group


Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
6148Line Item Revision to SEMI G18-96 (Reapproved 0811) “Standard for Integrated Circuit Leadframe Material Used in the Production of Etched Leadframes” with non-conforming title change to “Specification for Integrated Circuit Leadframe Material Used in the Production of Etched Leadframes”
-
#6148_LineItemLetterBallotReviewSheet.pdf#6148_LineItemLetterBallotReviewSheet.pdf
Line Item 1Change nonconforming titlePassed as balloted
Superclean
-
Line Item 2Change section titles to meet the requirement which is specified section 3.2 of Procedure ManualPassed as balloted
Superclean
-
6149Line Item Revision to SEMI G38-0996 (Reapproved 0811) “Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages”
-
#6149_LineItemLetterBallotReviewSheet.pdf#6149_LineItemLetterBallotReviewSheet.pdf
Line Item 1Change section titles to meet the requirement which is specified section 3.2 of Procedure ManualPassed as balloted
Superclean
-
Line Item 2Add “Calculation” section title and get re-formatted to meet the requirement which is specified section 3.2 of Procedure ManualPassed as balloted
Superclean
-
6150Line Item Revision to SEMI G56-93 (Reapproved 0811) “Test Method for Measurement of Silver Plating Thickness”
-
#6150_LineItemLetterBallotReviewSheet.pdf#6150_LineItemLetterBallotReviewSheet.pdf
Line Item 1Re-format some parts as to meet the requirement which is specified section 3.2 of Procedure Manual.Passed as balloted
Superclean
-
6151Line Item Revision to SEMI G65-96 (Reapproved 0811) “Test Method for Evaluation of Leadframe Materials Used for L-Leaded (Gull Wing Type) Packages”
-
#6151_LineItemLetterBallotReviewSheet.pdf#6151_LineItemLetterBallotReviewSheet.pdf
Line Item 1Re-format some parts as to meet the requirement which is specified section 3.2 of Procedure Manual.Passed as balloted
Superclean
-
6153Reapproval of SEMI G90-0811: Specification for 300 mm Wafer Coin-Stack Type Shipping Container Used for Test and Packaging ProcessesPassed as balloted
Superclean
#6153_Reapproval_LetterBallotReviewSheet.pdf#6153_Reapproval_LetterBallotReviewSheet.pdf
6155Line Item Revision to SEMI G62-95 (Reapproved 0811) “Test Method for Silver Plating Quality”
-
#6155_LineItemLetterBallotReviewSheet.pdf#6155_LineItemLetterBallotReviewSheet.pdf
Line Item 1Re-format some parts as to meet the requirement which is specified section 3.2 of Procedure Manual.Passed as balloted
Superclean
-
6157Reapproval of SEMI G23-0996 (Reapproved 0811): Test Method of Inductance for Internal Traces of Semiconductor PackagesPassed as balloted
Superclean
#6157_Reapproval_LetterBallotReviewSheet.pdf#6157_Reapproval_LetterBallotReviewSheet.pdf
6158Reapproval of SEMI G42-0996 (Reapproved 0811): Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor PackagesPassed as balloted
Superclean
#6158_Reapproval_LetterBallotReviewSheet.pdf#6158_Reapproval_LetterBallotReviewSheet.pdf
6159Reapproval of SEMI G59-94 (Reapproved 0811): Test Method for Measurement of Ionic Contamination on Leadframe Interleafing and the Contamination Transferred from the Interleafing to the LeadframesPassed as balloted
Superclean
#6159_Reapproval_LetterBallotReviewSheet.pdf#6159_Reapproval_LetterBallotReviewSheet.pdf
6160Reapproval of SEMI G60-94 (Reapproved 0811): Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing MaterialsPassed as balloted
Superclean
#6160_Reapproval_LetterBallotReviewSheet.pdf#6160_Reapproval_LetterBallotReviewSheet.pdf
6161Reapproval of SEMI G66-96 (Reapproved 0811): Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding CompoundsPassed as balloted#6161_LetterBallotReviewSheet.pdf#6161_LetterBallotReviewSheet.pdf
6162Reapproval of SEMI G67-0996 (Reapproved 0811): Test Method for the Measurement of Particle Generation from Sheet MaterialsPassed as balloted
Superclean
#6162_Reapproval_LetterBallotReviewSheet.pdf#6162_Reapproval_LetterBallotReviewSheet.pdf
6163Reapproval of SEMI G68-0996 (Reapproved 0811): Test Method for Junction-to-Case Thermal Resistance Measurements in Air Environment for Semiconductor PackagesPassed as balloted
Superclean
#6163_Reapproval_LetterBallotReviewSheet.pdf#6163_Reapproval_LetterBallotReviewSheet.pdf
6164Reapproval of SEMI G69-0996 (Reapproved 0811): Test Method for Measurement of Adhesive Strength Between Leadframes and Molding CompoundsPassed as balloted
Superclean
#6164_Reapproval_LetterBallotReviewSheet.pdf#6164_Reapproval_LetterBallotReviewSheet.pdf
6165Reapproval of SEMI G71-0996 (Reapproved 0811): Specification for Barcode Marking of Intermediate Containers for Packaging MaterialsPassed as balloted#6165_LetterBallotReviewSheet.pdf#6165_LetterBallotReviewSheet.pdf
6166Reapproval of SEMI G89-0211: Specification for Leadframe Strip SizePassed as balloted
Superclean
#6166_Reapproval_LetterBallotReviewSheet.pdf#6166_Reapproval_LetterBallotReviewSheet.pdf


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
SC/TF/WG
Details
TBDSEMI G4-0302 (Reapproved 0811)Revision to SEMI G4-0302 (Reapproved 0811): Specification for Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes
TBDSEMI G11-88 (Reapproved 0811)Revision to SEMI G11-88 (Reapproved 0811): “Recommended Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds” with non-conforming title change to “Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds”
TBDSEMI G13-88 (Reapproved 0811)Revision to SEMI G13-88 (Reapproved 0811): “Standard Test Method for Expansion Characteristics of Molding Compounds” with non-conforming title change to “Test Method for Expansion Characteristics of Molding Compounds”
TBDSEMI G15-93 (Reapproved 0811)Revision to SEMI G15-93 (Reapproved 0811): “Standard Test Method for Differential Scanning Calorimetry of Molding Compounds” with non-conforming title change to “Test Method for Differential Scanning Calorimetry of Molding Compounds”
TBDSEMI G24-89 (Reapproved 0811)Revision to SEMI G24-89 (Reapproved 0811): Test Method for Measuring the Lead-to-Lead and Loading Capacitance of Package Leads
TBDSEMI G25-89 (Reapproved 0811)Revision to SEMI G25-89 (Reapproved 0811): Test Method for Measuring the Resistance of Package Leads
TBDSEMI G28-0997 (Reapproved 0811)Revision to SEMI G28-0997 (Reapproved 0811): Specification for Leadframes for Plastic Molded S.O. Packages
TBDSEMI G29-1296E (Reapproved 0811)Line Item Revision to SEMI G29-1296E (Reapproved 0811): Test Method for Trace Contaminants in Molding Compounds
TBDSEMI G43-87 (Reapproved 0811)Revision to SEMI G43-87 (Reapproved 0811): Test Method for Junction-to-Case Thermal Resistance Measurements of Molded Plastic Packages
TBDSEMI G51-90 (Reapproved 0811)Revision to SEMI G51-90 (Reapproved 0811): Specification for Plastic Molded (Metric) Quad Flat Pack Leadframes
TBDSEMI G55-93 (Reapproved 0811)Revision to SEMI G55-93 (Reapproved 0811): Test Method for Measurement of Silver Plating Brightness


Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next 3D Packaging and Integration Japan TC Chapter meeting will be held as follows.
Wednesday, September 13
13:00-16:00
SEMI Japan office