SEMI International Standards
Standards Region: North America
Committee: Physical Interfaces & Carriers
Place of Meeting: SEMI Headquarters, Milpitas, California/USA
Date of Meeting: 11/06/2019
Recording SEMI Standards Staff: Laura Nguyen
CER Posted to Web: 11/08/2019


Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
Electron Microscopy Workflow TFTroy Morrison (Thermo Fisher Scientific)Laurens Kwakman (Thermo Fisher Scientific)


Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
SEMI E177SEMI E177-0919, Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows

(Editorial Changes Type 2)
Passed, to be submitted to ISC A&R SCSEMI E177 - Editorial Change (Outside Letter Ballot Process).pdfSEMI E177 - Editorial Change (Outside Letter Ballot Process).pdf



Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
Listing of all revised or new SNARF(s) approved by the Originating TC Chapter.
#
Type
SC/TF/WG
Details
6592SNARFElectron Microscopy Workflow TFNew Standard: Specification for Container for Transport and Storage of Transmission Electron Microscope (TEM) Lamella Carriers within Electron Microscopy Workflows


Authorized Ballots
None.


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Abolished
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting

The next meeting is scheduled in conjunction with the NA Standards Spring 2020 Meetings at SEMI Headquarters in Milpitas, California, March 30-April 2, 2020. For more information, please visit the Standards Calendar at http://www.semi.org/standards.

Tentative Schedule:

      Tuesday, March 31
        13:00-15:00 Electron Microscopy (EM) Workflow TF
        15:00-17:00 Japan PLP Panel FOUP TF
      Wednesday, April 1
      09:30-10:00 Global PIC Maintenance (TF)
        10:00-12:00 PIC (C)