SEMI International Standards
Standards Region: Europe
Committee: Photovoltaic - Materials
Place of Meeting: 11/12/2019
Date of Meeting: 11/21/2019
Recording SEMI Standards Staff: Jim Jackman
CER Posted to Web: 11/26/2019


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
6373New Standard: Test Method For Accelerated Cell Level Testing For Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility Of Solar CellsPassed with editorial changes
6543Reapproval of SEMI PV42-0314: Test Method for In-Line Measurement of Waviness of PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line SegmentsPassed
6544Reapproval of SEMI PV51-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using PhotoluminescencePassed
6545Reapproval of SEMI PV52-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers Regarding Grain SizePassed



Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots
None.


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Abolished
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
In conjunction with SEMICON Europa 2020 in Munich, Germany. Check the events page at https://www.semi.org/en/collaborate/standards for details.