SEMI International Standards
Standards Region: Europe
Committee: Photovoltaic - Materials
Place of Meeting: 11/12/2019
Date of Meeting: 11/21/2019
Recording SEMI Standards Staff: Jim Jackman
CER Posted to Web: 11/26/2019

Leadership Changes

Committee Structure Changes

Ballot Results

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
6373New Standard: Test Method For Accelerated Cell Level Testing For Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility Of Solar CellsPassed with editorial changes
6543Reapproval of SEMI PV42-0314: Test Method for In-Line Measurement of Waviness of PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line SegmentsPassed
6544Reapproval of SEMI PV51-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using PhotoluminescencePassed
6545Reapproval of SEMI PV52-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers Regarding Grain SizePassed

Activities Approved by the GCS between meetings of TC Chapter meeting

Authorized Activities

Authorized Ballots

SNARF(s) Granted a One-Year Extension

SNARF(s) Abolished

Standard(s) to receive Inactive Status

Special Announcements of the Committee (Workshops, Programs, etc.)

Next Meeting
In conjunction with SEMICON Europa 2020 in Munich, Germany. Check the events page at for details.