SEMI International Standards
Standards Locale: Europe |
Committee: Photovoltaic - Materials |
Place of Meeting: 11/12/2019 |
Date of Meeting: 11/21/2019 |
Meeting End Date: 11/21/2019 |
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Recording SEMI Standards Staff: Jim Jackman |
CER Posted to Web: 11/26/2019 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
6373 | New Standard: Test Method For Accelerated Cell Level Testing For Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility Of Solar Cells | Passed with editorial changes | |
6543 | Reapproval of SEMI PV42-0314: Test Method for In-Line Measurement of Waviness of PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments | Passed | |
6544 | Reapproval of SEMI PV51-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence | Passed | |
6545 | Reapproval of SEMI PV52-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers Regarding Grain Size | Passed | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
In conjunction with SEMICON Europa 2020 in Munich, Germany. Check the events page at https://www.semi.org/en/collaborate/standards for details.
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