SEMI International Standards
Standards Locale: Japan |
Committee: Silicon Wafer |
Place of Meeting: SEMI Japan |
Date of Meeting: 09/21/2017 |
Meeting End Date: 09/21/2017 |
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Recording SEMI Standards Staff: Junko Collins |
CER Posted to Web: 09/28/2017 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
TBD | SNARF | International Advanced Wafer Geometry Task Force | Line item Revision for M49 “GUIDE FOR SPECIFYING GEOMETRY MEASUREMENT SYSTEMS FOR SILICON WAFERS FOR THE 130 nm TO 16 nm TECHNOLOGY GENERATIONS" |
TBD | SNARF | JA Shipping Box Task Force | Line Item Revision to modify the nonconforming title of SEMI M31-0708 MECHANICAL SPECIFICATION FOR FRONT-OPENING SHIPPING BOX USED TO TRANSPORT AND SHIP 300 mm WAFERS |
Authorized Ballots
5774 | Cycle 8, 2017 | Japan Test Method Task Force | Practice for Sample Preparation Methods for Minority Carrier Diffusion Length Measurements in Silicon Wafers by Surface Photovoltage Methods |
TBD | Cycle 8, 2017 | International Advanced Wafer Geometry Task Force | Line item Revision for M49 “GUIDE FOR SPECIFYING GEOMETRY MEASUREMENT SYSTEMS FOR SILICON WAFERS FOR THE 130 nm TO 16 nm TECHNOLOGY GENERATIONS" |
TBD | Cycle 8, 2017 | JA Shipping Box Task Force | Line Item Revision to modify the nonconforming title of SEMI M31-0708 MECHANICAL SPECIFICATION FOR FRONT-OPENING SHIPPING BOX USED TO TRANSPORT AND SHIP 300 mm WAFERS |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
SEMI M24-0612 | Specification for Polished Monocrystalline Silicon Premium Wafers |
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
December 14, Thursday, 2017 13:00-17:00 at Tokyo Big Sight during SEMICON Japan 2017
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