SEMI International Standards
Standards Locale: Japan
Committee: Silicon Wafer
Place of Meeting: SEMI Japan
Date of Meeting: 09/21/2017
Meeting End Date: 09/21/2017
Recording SEMI Standards Staff: Junko Collins
CER Posted to Web: 09/28/2017


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

TBDSNARFInternational Advanced Wafer Geometry Task ForceLine item Revision for M49 “GUIDE FOR SPECIFYING GEOMETRY MEASUREMENT SYSTEMS FOR SILICON WAFERS FOR THE 130 nm TO 16 nm TECHNOLOGY GENERATIONS"
TBDSNARFJA Shipping Box Task ForceLine Item Revision to modify the nonconforming title of SEMI M31-0708 MECHANICAL SPECIFICATION FOR FRONT-OPENING SHIPPING BOX USED TO TRANSPORT AND SHIP 300 mm WAFERS


Authorized Ballots

5774Cycle 8, 2017Japan Test Method Task ForcePractice for Sample Preparation Methods for Minority Carrier Diffusion Length Measurements in Silicon Wafers by Surface Photovoltage Methods
TBDCycle 8, 2017International Advanced Wafer Geometry Task ForceLine item Revision for M49 “GUIDE FOR SPECIFYING GEOMETRY MEASUREMENT SYSTEMS FOR SILICON WAFERS FOR THE 130 nm TO 16 nm TECHNOLOGY GENERATIONS"
TBDCycle 8, 2017JA Shipping Box Task ForceLine Item Revision to modify the nonconforming title of SEMI M31-0708 MECHANICAL SPECIFICATION FOR FRONT-OPENING SHIPPING BOX USED TO TRANSPORT AND SHIP 300 mm WAFERS


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status

SEMI M24-0612Specification for Polished Monocrystalline Silicon Premium Wafers


Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
December 14, Thursday, 2017 13:00-17:00 at Tokyo Big Sight during SEMICON Japan 2017