SEMI International Standards
Standards Locale: Japan
Committee: Photovoltaic (PV) - Materials
Place of Meeting: SEMI Japan office, Tokyo
Date of Meeting: 09/11/2014
Meeting End Date: 09/11/2014
Recording SEMI Standards Staff: Chie Yanagisawa
CER Posted to Web: 09/26/2014


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Ballot #5532: New Standard “Test Method for Measurement of Cracks in PV Silicon Wafers in PV Modules by Laser Scanning” was adjudicated at the Japan TC Chapter meeting of PV Materials Global Technical Committee held on July 4. The TC Chapter incorrectly assessed this section and checked the box “Potentially material patented technology or copyrighted items are known but a Letter of Assurance (LOA) or copyright release for such material has been obtained or presented to the committee.”.

It became necessary to perform IP assessment defined in the Regulations §15.3.2 again because the owner of IP known at the time of July 4 meeting reported additional IPs of potential relevance upon submission of LOA.

The TC Chapter assessed as follows.

JP5015341B and JP2014041095A are PMPT for Ballot #5532. The TC Chapter determined on technical grounds that use of the PMPT is justified for Ballot #5532.


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The Japan TC Chapter of PV Global Technical Committee will hold the joint meeting with the Japan Chapter of PV Materials Global Technical Committee as below.
- Wednesday, December 10
- 13:30-17:00 [Japan Time]
- SEMI Japan office, Tokyo