SEMI International Standards
Standards Locale: Japan
Committee: Silicon Wafer
Place of Meeting: Tokyo, Japan
Date of Meeting: 06/12/2014
Meeting End Date: 06/12/2014
Recording SEMI Standards Staff: Naoko Tejima
CER Posted to Web: 06/19/2014


Leadership Changes

Group
Previous Leader
New Leader
Int’l Epitaxial Wafers Task ForceTakao Takenaka (Consultant)Naohisa Toda (Shin-Etsu Handotai)
Int’l 450mm Shipping Box Task ForceYasuhiro Shimizu (Shimizu Consulting)TBD
JA Shipping Box Task ForceYasuhiro Shimizu (Shimizu Consulting)TBD


Committee Structure Changes
None.

Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
5736SNARFInt’l SOI Wafers Task ForceLine Item Revision to M41-1213 Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
5737SNARFJA Test Method Task ForceRevision of SEMI MF1391-1107, Test method for substitutional atomic carbon content of silicon by infrared absorption


Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
SEMI Japan Standards Fall 2014 Meetings
Thursday, September 11, 2014, 13:30-17:30, SEMI Japan, Tokyo, Japan