SEMI International Standards
Standards Locale: Japan |
Committee: Flat Panel Display (FPD) - Materials & Components |
Place of Meeting: SEMI Japan, Tokyo |
Date of Meeting: 04/10/2015 |
Meeting End Date: 04/10/2015 |
|
Recording SEMI Standards Staff: Naoko Tejima |
CER Posted to Web: 04/21/2015 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5555 | Revised SNARF | Polarizing Film Task Force | Revision to SEMI D50-0707, Test Method for Surface Hardness of FPD Polarizing Film with title change to: Test Method for Surface Hardness of FPD components |
Authorized Ballots
# | When | SC/TF/WG | Details |
5555 | C5-15 | Polarizing Film Task Force | Revision to SEMI D50-0707, Test Method for Surface Hardness of FPD Polarizing Film with title change to: Test Method for Surface Hardness of FPD components |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
SEMI Japan Standards Summer 2015 Meetings
Monday, July 27, 2015, SEMI Japan, Tokyo, Japan
Copyright ©2024 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.